scholarly journals Twin-Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter

2016 ◽  
Vol 99 (9) ◽  
pp. 92-100
Author(s):  
NOBUO SATOH ◽  
EIKA TSUNEMI ◽  
KEI KOBAYASHI ◽  
TAKASHI KOMATSUBARA ◽  
SEIJI HIGUCHI ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Beam Splitter ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

Twin-probe Atomic Force Microscopy with Optical Beam Deflection using Vertically Incident Lasers by Two Beam Splitter

2015 ◽  
Vol 135 (4) ◽  
pp. 135-141 ◽  
Author(s):  
Nobuo Satoh ◽  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Takashi Komatsubara ◽  
Seiji Higuchi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Beam Splitter ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

2007 ◽  
Vol 46 (8B) ◽  
pp. 5636-5638 ◽  
Author(s):  
Eika Tsunemi ◽  
Nobuo Satoh ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

1992 ◽  
Vol 72 (1) ◽  
pp. 6-12 ◽  
Author(s):  
Constant A. J. Putman ◽  
Bart G. De Grooth ◽  
Niek F. Van Hulst ◽  
Jan Greve
Keyword(s):  
Atomic Force Microscopy ◽  
Detailed Analysis ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy

2019 ◽  
Vol 74 (2) ◽  
pp. 88-93 ◽  
Author(s):  
Bernard Ouma Alunda ◽  
Luke Oduor Otieno ◽  
Melody Chepkoech ◽  
Clare Chisu Byeon ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Readout Circuits ◽  
Atomic Force
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