A low-cost and reliable optical inspection system for rapid surface roughness measurements of polycrystalline thin films

2012 ◽  
Vol 43 (10) ◽  
pp. 878-885 ◽  
Author(s):  
C.-C. Kuo ◽  
P.-J. Huang
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Low Cost ◽  
Inspection System ◽  
Optical Inspection ◽  
Polycrystalline Thin Films ◽  
Optical Inspection System ◽  
Roughness Measurements

A low-cost optical inspection system for rapid surface roughness measurements of CrCN hard films

Optik ◽  
2013 ◽  
Vol 124 (14) ◽  
pp. 1902-1906 ◽  
Author(s):  
Chil-Chyuan Kuo ◽  
Yi-Ruei Chen ◽  
Cheng-Yi Tong ◽  
Jyh-Wei Lee
Keyword(s):  
Surface Roughness ◽  
Low Cost ◽  
Inspection System ◽  
Optical Inspection ◽  
Optical Inspection System ◽  
Roughness Measurements

A New Optical Technique for Surface Roughness Measurement of Tio2 Thin Films

2011 ◽  
Vol 110-116 ◽  
pp. 831-838
Author(s):  
Chil Chyuan Kuo ◽  
Yi Ruei Chen
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Peak Power ◽  
Incident Angle ◽  
Inspection Time ◽  
Inspection System ◽  
Tio2 Thin Films ◽  
Optical Inspection ◽  
Measuring Surface ◽  
Optical Inspection System

A rapid optical inspection system for rapid measuring the surface roughness of titanium dioxide (TiO2) thin films is developed in this work. The incident angle of 60° is a good candidate for measuring surface roughness of TiO2 thin films and y = 90.391x + 0.5123 is a trend equation for predicting the surface roughness of TiO2 thin films. Roughness average (Ra) of TiO2 thin films (y) can be directly deduced from the peak power density (x) using the optical inspection system developed. The results were verified by white-light interferometer. The best measurement error rate of the optical inspection system developed can be controlled about 8.8%.The saving in inspection time of the surface roughness of TiO2 thin films is up to 83%.

Algorithms for a Fast Confocal Optical Inspection System

1996 ◽  
pp. 439-474
Author(s):  
A. R. Rao ◽  
N. Ramesh ◽  
F. Y. Wu ◽  
J. R. Mandeville ◽  
P. Kerstens
Keyword(s):  
Inspection System ◽  
Optical Inspection ◽  
Optical Inspection System

scholarly journals Characterization and photoelectrochemical properties of CICS thin films grown via an electrodeposition route

RSC Advances ◽  
2017 ◽  
Vol 7 (47) ◽  
pp. 29469-29480 ◽  
Author(s):  
Adel Chihi ◽  
Brahim Bessais
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Low Cost ◽  
Electrochemical Technique ◽  
Photoelectrochemical Properties ◽  
Polycrystalline Thin Films ◽  
Ito Glass ◽  
Ce Content

In this work, cerium doped CuInS2 (CIS) polycrystalline thin films with different Ce content are firstly synthesized on indium doped tin oxide (ITO) glass via a low-cost electrochemical technique.

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