X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation
2011 ◽
Vol 208
(11)
◽
pp. 2552-2557
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Keyword(s):
X Ray
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2012 ◽
Vol 560-561
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pp. 892-898
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1990 ◽
Vol 157
(2)
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pp. 255-270
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Keyword(s):
Keyword(s):
1996 ◽
Vol 159
(1-4)
◽
pp. 694-702
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Keyword(s):
2020 ◽
Vol 76
(3)
◽
pp. 328-333