The remote electron beam-induced current analysis of grain boundaries in semiconducting and semi-insulating materials
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2002 ◽
Vol 14
(48)
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pp. 13161-13168
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2005 ◽
Vol 52
(12)
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pp. 1211-1215
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2009 ◽
Vol 156-158
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pp. 561-565
2004 ◽
Vol 96
(10)
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pp. 5490-5495
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1998 ◽
Vol 16
(2)
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pp. 825-829
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1983 ◽
Vol 54
(8)
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pp. 1005-1008
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