In Situ Detection of Flaws in Multilayer Ceramic Capacitors Using Electronic Speckle Pattern Interferometry

Author(s):  
Y. C. Chan ◽  
F. Yeung ◽  
G. C. Jin ◽  
N. K. Bao ◽  
P. S. Chung
2019 ◽  
Vol 60 (10) ◽  
pp. 2109-2113
Author(s):  
Naoyuki Kawamoto ◽  
Hiroyuki Ono ◽  
Yasuhiro Terasaki ◽  
Yoshinori Fujikawa ◽  
Yasukazu Murakami ◽  
...  

2013 ◽  
Vol 102 (14) ◽  
pp. 142904 ◽  
Author(s):  
Keng-Ren Lin ◽  
Chih-Han Chang ◽  
Cheng-Hung Chiang ◽  
Che-Hsin Lin

2019 ◽  
Vol 39 (4) ◽  
pp. 1178-1185 ◽  
Author(s):  
J.M. Ingman ◽  
J.P.A. Jormanainen ◽  
A.M. Vulli ◽  
J.D. Ingman ◽  
K. Maula ◽  
...  

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