Peptides as Bio-inspired Molecular Electronic Materials

Author(s):  
John Horsley ◽  
Jingxian Yu ◽  
Yuan Qi Yeoh ◽  
Andrew Abell
2011 ◽  
Vol 15 (07n08) ◽  
pp. 505-516 ◽  
Author(s):  
Jonathan S. Lindsey ◽  
Patchanita Thamyongkit ◽  
Masahiko Taniguchi ◽  
David F. Bocian

An approach for information storage employs tetrapyrrole macrocycles as charge-storage elements attached to a (semi)conductor in hybrid chips. Anti-counterfeiting measures must cohere with the tiny amounts of such electroactive material and strict constraints on composition in chips; accordingly, the incorporation of typical anti-counterfeiting taggants or microcarriers is precluded. The provenance of the tetrapyrroles can be established through the use of isotopic substitution integral to the macrocycle. The isotopic substitution can be achieved by rational site-specific incorporation or by combinatorial procedures. The formation of a mixture of such macrocycles with various isotopic composition (isotopically unmodified, isotopologues, isotopomers) provides the molecular equivalent of an indelible printed watermark. Resonance Raman spectroscopic examination can reveal the watermark, but not the underlying molecular and isotopic composition; imaging mass spectrometry can reveal the presence of isotopologues but cannot discriminate among isotopomers. Hence, deciphering the code that encrypts the watermark in an attempt at forgery is expected to be prohibitive. A brief overview is provided of strategies for incorporating isotopes in meso-substituted tetrapyrrole macrocycles.


2003 ◽  
Author(s):  
S. Kuroda ◽  
K. Ikegami ◽  
K. Saito ◽  
M. Saito ◽  
M. Sugi ◽  
...  

2017 ◽  
Vol 19 (17) ◽  
pp. 10854-10862 ◽  
Author(s):  
Florian Steiner ◽  
Carl Poelking ◽  
Dorota Niedzialek ◽  
Denis Andrienko ◽  
Jenny Nelson

We present a multi-scale model for charge transport across grain boundaries in molecular electronic materials that incorporates packing disorder, electrostatic and polarisation effects.


2012 ◽  
Vol 53 (6) ◽  
pp. 657-660 ◽  
Author(s):  
Robert A. Valentine ◽  
Alexander Whyte ◽  
Kunio Awaga ◽  
Neil Robertson

2002 ◽  
Vol 12 (9) ◽  
pp. 2565-2575 ◽  
Author(s):  
Tetsuo Otsubo ◽  
Yoshio Aso ◽  
Kazuo Takimiya

2017 ◽  
Vol 5 (7) ◽  
pp. 5994-5998 ◽  
Author(s):  
Mathieu Lamarche ◽  
Minh Trung Dang ◽  
Josianne Lefebvre ◽  
James D. Wuest ◽  
Sjoerd Roorda

2022 ◽  
Author(s):  
Margaret Kocherga ◽  
Kevin M. Boyle ◽  
Jon W Merkert ◽  
Thomas Andrew Schmedake ◽  
Michael G Walter

Hexacoordinate silicon pincer complexes using 2,6-bis(benzimidizol-2-yl)pyridine (bzimpy) ligands have been developed as a multifunctional, molecular electronic materials platform. We report the synthesis, characterization, and device application of a variety of...


Author(s):  
S.F. Corcoran

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.


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