High Resolution and High Spatial Resolution of Analytical Electron Microscopy

2012 ◽  
pp. 379-490
Author(s):  
Yonghua Rong
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

High spatial resolution analytical electron microscopy studies on the Co/CeO2 system

1988 ◽  
Vol 12 (1) ◽  
pp. 3-10 ◽  
Author(s):  
C. Colliex ◽  
D. Ugarte ◽  
Z. L. Wang ◽  
M. Gasgnier ◽  
V. Paul-Boncour
Keyword(s):  
Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

High Spatial Resolution Assessment of the Structure, Composition, and Electronic Properties of Nanowire Arrays

2001 ◽  
Vol 635 ◽  
Author(s):  
M.S. Sander ◽  
A.L. Prieto ◽  
Y.M. Lin ◽  
R. Gronsky ◽  
A.M. Stacy ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Analytical Electron Microscopy ◽  
Nanowire Arrays ◽  
Composition Gradient ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Electron Energy Loss

AbstractWe have employed transmission electron microscopy (TEM) and analytical electron microscopy to perform preliminary assessment of the structure, composition and electronic properties of nanowire arrays at high spatial resolution. The two systems studied were bismuth and bismuth telluride nanowire arrays in alumina (wire diameters ~40nm), both of which are promising for thermoelectric applications. Imaging coupled with diffraction in the TEM was employed to determine the grain size in electrodeposited Bi2Te3 nanowires. In addition, a composition gradient was identified along the wires in a short region near the electrode by energy-dispersive x-ray spectroscopy. Electron energy loss spectroscopy combined with energy-filtered imaging in the TEM revealed the excitation energy and spatial variation of plasmons in bismuth nanowire arrays.

scholarly journals Analytical High-resolution Electron Microscopy Reveals Organ-specific Nanoceria Bioprocessing

2017 ◽  
Vol 46 (1) ◽  
pp. 47-61 ◽  
Author(s):  
Uschi M. Graham ◽  
Robert A. Yokel ◽  
Alan K. Dozier ◽  
Lawrence Drummy ◽  
Krishnamurthy Mahalingam ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Dark Field ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Organ Specific

This is the first utilization of advanced analytical electron microscopy methods, including high-resolution transmission electron microscopy, high-angle annular dark field scanning transmission electron microscopy, electron energy loss spectroscopy, and energy-dispersive X-ray spectroscopy mapping to characterize the organ-specific bioprocessing of a relatively inert nanomaterial (nanoceria). Liver and spleen samples from rats given a single intravenous infusion of nanoceria were obtained after prolonged (90 days) in vivo exposure. These advanced analytical electron microscopy methods were applied to elucidate the organ-specific cellular and subcellular fate of nanoceria after its uptake. Nanoceria is bioprocessed differently in the spleen than in the liver.

High-resolution analytical electron microscopy of catalytically etched silicon nanowires

2009 ◽  
Vol 95 (2) ◽  
pp. 325-327 ◽  
Author(s):  
M. Schade ◽  
N. Geyer ◽  
B. Fuhrmann ◽  
F. Heyroth ◽  
H. S. Leipner
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Silicon Nanowires ◽  
Analytical Electron Microscopy ◽  
Analytical Electron ◽  
Etched Silicon

Chemical Nano-tomography of Self-assembled Ge-Si:Si(001) Islands from Quantitative High Resolution Transmission Electron Microscopy

2009 ◽  
Vol 1184 ◽  
Author(s):  
Luciano Andrey Montoro ◽  
Marina Leite ◽  
Daniel Biggemann ◽  
Fellipe Grillo Peternella ◽  
Kees Joost Batenburg ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Three Dimensional ◽  
Precise Knowledge ◽  
Transmission Electron ◽  
Self Consistent ◽  
Chemical Distribution

AbstractThe knowledge of composition and strain with high spatial resolution is highly important for the understanding of the chemical and electronic properties of alloyed nanostructures. Several applications require a precise knowledge of both composition and strain, which can only be extracted by self-consistent methodologies. Here, we demonstrate the use of a quantitative high resolution transmission electron microscopy (QHRTEM) technique to obtain two-dimensional (2D) projected chemical maps of epitaxially grown Ge-Si:Si(001) islands, with high spatial resolution, at different crystallographic orientations. By a combination of these data with an iterative simulation, it was possible infer the three-dimensional (3D) chemical arrangement on the strained Ge-Si:Si(001) islands, showing a four-fold chemical distribution which follows the nanocrystal shape/symmetry. This methodology can be applied for a large variety of strained crystalline systems, such as nanowires, epitaxial islands, quantum dots and wells, and partially relaxed heterostructures.

New precipitate morphology in heat treated CZ Si wafers

1983 ◽  
Vol 41 ◽  
pp. 152-153
Author(s):  
H.L. TSAI ◽  
R.W. CARPENTER
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
Interstitial Oxygen ◽  
Precipitate Morphology ◽  
Silicon Ingot ◽  
Heat Treated ◽  
Initial Carbon ◽  
Analytical Electron ◽  
Plate Type

The morphological forms of the precipitates and other defects in the heat-treated oxygen-containing CZ silicon have been extensively documented, but little information concerning the morphology as a function of the position in the ingot has been reported. Recent studies, using high resolution analytical electron microscopy, have shown that plate type precipitates observed in the seed end of the silicon ingot were amorphous and contain oxygen. We have carried out a detailed TEM study of the precipitate morphology in the heat-treated wafers cut from the seed, middle, and tang regions of the CZ ingot. The interstitial oxygen concentrations in the as grown Si were 2.1×1018cm−3, 1.6×10−18cm−3, and 1.5×1018cm−3 in the seed, middle and tang regions, respectively. Initial carbon was below IR detectability limit, but was higher in the tail than seed, based on segregation coefficients. The wafers were subjected to two-step anneals: 1. 0-16 hrs., 800°C in nitrogen and 2. 16 hrs., 1050°C in dry oxygen.

High-resolution analytical electron microscopy (HRAEM) study of LaCo5 intermetallic catalysts

1986 ◽  
Vol 44 ◽  
pp. 768-769
Author(s):  
Z. L. Wang ◽  
C. Colliex ◽  
V. Paul-Boncour ◽  
A. Percheron-Guegan
Keyword(s):  
Electron Microscopy ◽  
Data Analysis ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Analytical Electron Microscopy ◽  
Radiation Absorption ◽  
Microscopic Structure ◽  
Analytical Electron ◽  
Metal Support ◽  
Absorption Measurements

Intermetal1ic compounds, such as LaCo5, have been used as active and selective catalysts in chemical reaction involving (CO,H2) mixtures. The general understanding regarding these catalysts is that the observed activation is associated with a partial transformation of the intermetallic component into a metal-support system. The macroscopic study of LaCo3 by use of synchrotron radiation absorption measurements (EXAFS and XANES data analysis) largely support this hypothesis. In this work, the microscopic structure of these catalysts has been studied by HRAEM.

scholarly journals High-Resolution Analytical Electron Microscopy Reveals Cell Culture Media-Induced Changes to the Chemistry of Silver Nanowires

2013 ◽  
Vol 47 (23) ◽  
pp. 13813-13821 ◽  
Author(s):  
Shu Chen ◽  
Ioannis G. Theodorou ◽  
Angela E. Goode ◽  
Andrew Gow ◽  
Stephan Schwander ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Cell Culture ◽  
High Resolution ◽  
Culture Media ◽  
Silver Nanowires ◽  
Analytical Electron Microscopy ◽  
Cell Culture Media ◽  
Analytical Electron ◽  
Induced Changes

The Raft-Like Structure of Supported PtRu5

1997 ◽  
Vol 497 ◽  
Author(s):  
J. C. Yang ◽  
S. Bradley ◽  
M. N. Nashner ◽  
R. Nuzzo ◽  
J. M. Gibson
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Analytical Electron Microscopy ◽  
Average Diameter ◽  
Atomic Concentration ◽  
Analytical Electron ◽  
Microscopy Techniques

ABSTRACTWe have examined supported PtRus specimens by a variety of electron microscopy techniques, including high resolution, analytical and a novel mass-spectroscopic electron microscopy techniques. Analytical electron microscopy results showed that the relative atomic concentration of Pt to Ru for each PtRu5 cluster is 1 to 5. The average diameter of the clusters was a 15.6Å, and the average number of atoms was measured to be 24 atoms per cluster. The combination of these techniques demonstrate that the PtRu5 clusters are raft-like on the carbon black support.

On the Spatial Resolution in Analytical Electron Microscopy

1998 ◽  
pp. 59-64
Author(s):  
Aldo Armigliato ◽  
David J. Howard ◽  
Roberto Balboni ◽  
Stefano Frabboni ◽  
Matty R. Caymax
Keyword(s):  
Electron Microscopy ◽  
Spatial Resolution ◽  
Analytical Electron Microscopy ◽  
Analytical Electron
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