On the extraction of optical sums from experimental generalized oscillator strengths and the experimental determination of the x-ray incoherent scattering factory by electron scattering

1973 ◽  
Vol 18 (3) ◽  
pp. 454-456 ◽  
Author(s):  
Russell A. Bonham
2003 ◽  
Vol 125 (42) ◽  
pp. 12894-12906 ◽  
Author(s):  
Erik C. Wasinger ◽  
Frank M. F. de Groot ◽  
Britt Hedman ◽  
Keith O. Hodgson ◽  
Edward I. Solomon

Metrologia ◽  
2019 ◽  
Vol 56 (6) ◽  
pp. 065007
Author(s):  
Malte Wansleben ◽  
Yves Kayser ◽  
Philipp Hönicke ◽  
Ina Holfelder ◽  
André Wählisch ◽  
...  

1997 ◽  
Vol 7 (4) ◽  
pp. 323-331 ◽  
Author(s):  
G Feiertag ◽  
W Ehrfeld ◽  
H Lehr ◽  
A Schmidt ◽  
M Schmidt

1966 ◽  
Vol 10 ◽  
pp. 42-45 ◽  
Author(s):  
M. Renninger

AbstractA double diffractometric method which allows clean separation of the thermal diffuse contribution from X-ray reflection peaks is demonstrated.


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