Thermal expansion of NaTi2(PO4)3 studied by rietveld method from X-ray diffraction data

1989 ◽  
Vol 24 (5) ◽  
pp. 611-618 ◽  
Author(s):  
J.L. Rodrigo ◽  
P. Carrasco ◽  
J. Alamo
Keyword(s):  
Thermal Expansion ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray

Structure Refinements of the Layered Intergrowth Phases SbIIISbV x A 1−x TiO6 (x≃0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

1997 ◽  
Vol 53 (6) ◽  
pp. 861-869 ◽  
Author(s):  
C. D. Ling ◽  
J. G. Thompson ◽  
S. Schmid ◽  
D. J. Cookson ◽  
R. L. Withers
Keyword(s):  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Homologous Series ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
The Family

The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA 3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xA n−xTiO4n+2 are part of a structurally homologous series.

The crystal structure and thermal expansion of the CCl4 adduct of Dianin's compound

1990 ◽  
Vol 68 (8) ◽  
pp. 1352-1356 ◽  
Author(s):  
Walter Abriel ◽  
André Du Bois ◽  
Marek Zakrzewski ◽  
Mary Anne White
Keyword(s):  
Crystal Structure ◽  
Thermal Expansion ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Guest Molecules ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Expansion Coefficients ◽  
Dianin's Compound

The crystal structure of the title compound has been determined by single crystal X-ray diffraction data collected at 293 K, and refined to a final Rw of 0.057. The crystals are rhombohedral, space group [Formula: see text], with a = 27.134(8) Å, c = 10.933(2) Å, and Z = 18. The mole ratio of Dianin's compound (4-p-hydroxyphenyl-2,2,4-trimethylchroman) to CCl4 is 6:1. The guest molecules are disordered. X-ray powder diffraction was carried out in the temperature range from 10 to 300 K. From this, the thermal expansion coefficients for the a- and c-axes and the volume have been determined. Keywords: thermal expansion, crystal structure, clathrate.

Structure analysis of YBa2Cu3O7-δ thin films from X-ray diffraction data using Rietveld method

1994 ◽  
Vol 235-240 ◽  
pp. 633-634
Author(s):  
M. Pissas ◽  
E. Moraitakis ◽  
V. Phycharis ◽  
D. Niarchos
Keyword(s):  
Thin Films ◽  
Structure Analysis ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray

Crystal structure and powder X-ray diffraction data for new Tb3CuAl3Ge2 compound

2015 ◽  
Vol 30 (1) ◽  
pp. 63-66 ◽  
Author(s):  
Chao Zeng ◽  
Guoqiang Lin ◽  
Weijing Zeng ◽  
Wei He
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Unit Cell ◽  
Type Structure ◽  
X Ray Diffraction ◽  
Quaternary Compound ◽  
Space Group ◽  
X Ray

The crystal structure of new Tb3CuAl3Ge2 quaternary compound was studied by the Rietveld method from powder X-ray diffraction (XRD) data. The Tb3CuAl3Ge2 compound crystallized in the hexagonal Y3NiAl3Ge2-type structure with space group P-62m (no. 189) and lattice parameters a = 7.0041(2) Å, c = 4.1775(1) Å, V = 177.48 Å3. There is only one formula in each unit cell, Z = 1, and the density of Tb3CuAl3Ge2 is ρx = 7.1696 g cm−3. The reliability factors characterizing the Rietveld refinement results are Rp = 6.43%, Rwp = 8.65%, RB = 4.81%, and RF = 4.09%, respectively. The powder XRD data of Tb3CuAl3Ge2 were presented and the reliability of indexation is F30 = 120.9(0.0073, 34).

scholarly journals On the crystal structure of the ordered vacancy compound Cu3In5Te9

2019 ◽  
Vol 65 (4 Jul-Aug) ◽  
pp. 360 ◽  
Author(s):  
G. E. Delgado ◽  
C. Rincón ◽  
G. Marroquin
Keyword(s):  
Crystal Structure ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Models ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Unit Cell Parameters ◽  
Space Group ◽  
X Ray ◽  
Cell Parameters

The crystal structure of the ordered vacancy compound (OVC) Cu3In5Te9 was analyzed using powder X-ray diffraction data. Several structural models were derived from the structure of the Cu-poor Cu-In-Se compound b-Cu0.39In1.2Se2 by permuting the cations in the available site positions. The refinement of the best model by the Rietveld method in the tetragonal space group P2c (Nº 112), with unit cell parameters a = 6.1852(2) Å, c = 12.3633(9) Å, V = 472.98(4) Å3, led to Rp = 7.1 %, Rwp = 8.5 %, Rexp = 6.4 %, S = 1.3 for 162 independent reflections. This model has the following Wyckoff site atomic distribution: Cu1 in 2e (0,0,0); In1 in 2f (½,½,0), In2 in 2d (0,½,¼); Cu2-In3 in 2b (½,0,¼); in 2a (0,0,¼); Te in 8n (x,y,z).

scholarly journals New triple molybdate and tungstate Na5Rb7Sc2(XO4)9 (X = Mo, W)

2021 ◽  
Vol 8 (4) ◽  
pp. 20218412
Author(s):  
Tatyana S. Spiridonova ◽  
Aleksandra A. Savina ◽  
Evgeniy V. Kovtunets ◽  
Elena G. Khaikina
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Rietveld Method ◽  
Ceramic Technology ◽  
Chemical Transformations ◽  
X Ray Diffraction ◽  
X Ray ◽  
Triple Molybdate ◽  
High Thermal Expansion ◽  
New Compounds

New compounds of the composition Na5Rb7Sc2(XO4)9 (X = Mo, W) were obtained via the ceramic technology. The sequences of chemical transformations occurring during the formation of these compounds were established, and their primary characterization was performed. Both Na5Rb7Sc2(XO4)9 (X = Mo, W) were found to melt incongruently at 857 K (X = Mo) and 889 K (X = W). They are isostructural to Ag5Rb7Sc2(XO4)9 (X = Mo, W), Na5Cs7Ln2(MoO4)9 (Ln = Tm, Yb, Lu) and crystallize in the trigonal crystal system (sp. gr. R32). The crystal structures were refined with the Rietveld method using the powder X-ray diffraction data. The thermal expansion of Na5Rb7Sc2(WO4)9 was studied by high-temperature powder X-ray diffraction; it was shown that this triple tungstate belongs to high thermal expansion materials.

scholarly journals Synthesis, Structure and Thermophysical Properties of Phosphates MNi0.5Zr1.5(PO4)3 (M = Mg, Ca, Sr)

2010 ◽  
Vol 12 (3,4) ◽  
pp. 241 ◽  
Author(s):  
M.V. Sukhanov ◽  
I.A. Schelokov ◽  
V.I. Pet'kov ◽  
E.R. Gobechiya ◽  
Yu.K. Kabalov ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Heat Capacity ◽  
Thermal Expansion ◽  
High Temperature ◽  
Single Phase ◽  
Rietveld Method ◽  
Type Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Expansion Behavior

<p>New phosphates MNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3</sub> (M = Mg, Ca, Sr) were prepared by the precipitating method.<strong><em> </em></strong>Phosphates were characterized using X-ray powder diffraction, IR-spectroscopy and electron microprobe analyses. The crystal structure of phosphates was refined by the Rietveld method. Phosphates CaNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3</sub> and SrNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3</sub> are shown to have been crystallized in the NaZr<sub>2</sub>(PO<sub>4</sub>)<sub>3</sub>-type structure and the phosphate MgNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3 </sub>was obtained as a single-phase with Sc<sub>2</sub>(WO<sub>4</sub>)<sub>3</sub>-type structure. Heat capacity of phosphate CaNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3</sub> was measured in the range 7 – 650 K and increased monotonically over the entire temperature range studied. Thermal expansion of phosphate CaNi<sub>0.5</sub>Zr<sub>1.5</sub>(PO<sub>4</sub>)<sub>3</sub> was studied in the interval 295-1073 K by the high temperature X-ray diffraction. This phosphate is similar to the best low-expansion ceramics, such as zircon, cordierite and silica glass in thermal expansion behavior.</p>

Structural Disorder and Thermal Dilatation Behavior in Cr-Doped Mullite

1994 ◽  
Vol 346 ◽  
Author(s):  
M.P. Villar ◽  
J.M. Geraldia ◽  
L. Gago-Duport
Keyword(s):  
Thermal Expansion ◽  
Diffraction Data ◽  
Chromium Content ◽  
Sol Gel ◽  
Structural Disorder ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Anisotropic Expansion ◽  
Thermal Dilatation

ABSTRACTLattice parameters of some different chromium-doped mullites obtained by a sol-gel route and sintered at 1650° C have been determined from X-Ray Diffraction data as a function of both temperature and Cr contents. Profile refinements on the X-ray diffraction diagrams have been carried out, showing that, at temperatures between 800° and 1535° C, an anisotropic thermal expansion takes place for the a and b lattice parameters of the Cr-doped mullite. We show that this anisotropic expansion is dependent on the temperature increase and the chromium content for the different compositions of the mullite crystals.

Thermal expansion in the AgGa(S1−xSex)2 solid solutions from X-ray diffraction data

1994 ◽  
Vol 29 (4) ◽  
pp. 561-568 ◽  
Author(s):  
N. S. Orlova ◽  
O. E. Kochkarik ◽  
I. V. Bodnar
Keyword(s):  
Thermal Expansion ◽  
Solid Solutions ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray
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