Giant nonlinear losses in GaSe crystals under double two-photon resonant conditions. Valence band structure from induced free carrier absorption

1991 ◽  
Vol 80 (4) ◽  
pp. 303-306 ◽  
Author(s):  
R. Baltramiejūnas ◽  
V. Gavryushin ◽  
G. Račiukaitis
2011 ◽  
Vol 109 (3) ◽  
pp. 033102 ◽  
Author(s):  
Srini Krishnamurthy ◽  
Zhi Gang Yu ◽  
Leonel P. Gonzalez ◽  
Shekhar Guha

2010 ◽  
Vol 82 (23) ◽  
Author(s):  
Peter D. Olszak ◽  
Claudiu M. Cirloganu ◽  
Scott Webster ◽  
Lazaro A. Padilha ◽  
Shekhar Guha ◽  
...  

2011 ◽  
Vol 98 (14) ◽  
pp. 143102 ◽  
Author(s):  
P. Kumar ◽  
A. Wade ◽  
L. M. Smith ◽  
H. E. Jackson ◽  
J. M. Yarrison-Rice ◽  
...  

1983 ◽  
Vol 13 ◽  
Author(s):  
Michael P. Hasselbeck ◽  
H. S. Kwok

ABSTRACTPulsed 10.6μm TEA CO2 laser light has been used to melt the semiconductors silicon and InSb. Measurements indicate that generation of free carriers necessary for melting may take place by nonlinear processes such as two-photon absorption or intraband avalanche ionization. If the semiconductor is sufficiently doped, melting may also result from linear free carrier absorption. In all cases, it appears that the molten depth exceeds several μm, which is much greater than obtained with lasers of shorter wavelength.


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