Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction

1991 ◽  
Vol 79 (11) ◽  
pp. 923-928 ◽  
Author(s):  
A. Bensaid ◽  
G. Patrat ◽  
M. Brunel ◽  
F. de Bergevin ◽  
R. Hérino
Keyword(s):  
Porous Silicon ◽  
Grazing Incidence ◽  
X Ray

Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

2015 ◽  
Vol 212 (3) ◽  
pp. 523-528 ◽  
Author(s):  
Philipp Hönicke ◽  
Blanka Detlefs ◽  
Matthias Müller ◽  
Erik Darlatt ◽  
Emmanuel Nolot ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
X Ray ◽  
Gradient Systems

The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays

2009 ◽  
Vol 24 (6) ◽  
pp. 792 ◽  
Author(s):  
Alex von Bohlen ◽  
Markus Krämer ◽  
Christian Sternemann ◽  
Michael Paulus
Keyword(s):  
Coherence Length ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Sign in / Sign up

Export Citation Format

Share Document