Characterization of thin film materials by 400 kV electron microscope images and with an energy filter

1996 ◽  
Vol 46 (1) ◽  
pp. 7-14 ◽  
Author(s):  
H. Hashimoto ◽  
Y. Makita ◽  
H. Endoh
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
Microscope Images

New Insights into the Generation Mechanism of Quasicrystal by the Surface Reaction Between Ultrafine Particles and Deposited Clusters

2003 ◽  
Vol 10 (02n03) ◽  
pp. 461-466 ◽  
Author(s):  
O. Kido ◽  
C. Kaito ◽  
Y. Saito
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
Ultrafine Particles ◽  
Surface Reaction ◽  
Generation Mechanism ◽  
Uniform Thickness ◽  
Microscope Images ◽  
Diffusion Rates ◽  
Al Thin Film ◽  
And Diffusion

On heating Mn-deposited Al particles (Mn–Al specimen) at 300°C, diffraction spots due to a Al86Mn14 quasicrystal appeared, in addition to those due to Al6Mn alloy. On heating a specimen of the Al-deposited Mn particles (Al–Mn specimen), Al50Mn50 alloy was formed. Neither the quasicrystal nor Al6Mn phases appeared. The electron microscope images of the Mn–Al specimen showed the existence of void clusters in the Al particles. This indicates that the alloys and the quasicrystals were produced by the diffusion of Al atoms to the Mn clusters. In the case of the Al–Mn specimen, the surface of Mn particles was covered with an Al thin film of uniform thickness. The surface Al layer changed to Al50Mn50 alloy. These results indicate that the diffusion direction of atoms and diffusion rates are different between Mn–Al and Al–Mn systems.

Mimicking the Formation of Biomineral Composites through Deposition of Calcium Carbonate Thin-Films on Modified Fiber Net Templates

2003 ◽  
Vol 774 ◽  
Author(s):  
Parayil Kumaran Ajikumar ◽  
Rajamani Lakshminarayanan ◽  
Valiyaveettil Suresh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electron Microscope ◽  
Calcium Carbonate ◽  
Scanning Electron Microscope ◽  
X Ray Diffraction ◽  
X Ray ◽  
Controlled Deposition ◽  
Scanning Electron

AbstractThin films of calcium carbonate were deposited on the surfaces of synthetic substrates using a simple biomimetic pathway. The Nylon 66 fiber knit pre-adsorbed with acidic polymers was used as a template for the controlled deposition of CaCO3 thin film. The presence of the soluble macromolecules on the fiber knit surface was characterized using ATR-FTIR spectroscopy. The characterization of the mineral films was carried out using scanning electron microscope (SEM), X-ray diffraction (XRD) and energy dispersive Xray scattering (EDX) studies.

SPELEEM: Combining LEEM and Spectroscopic Imaging

1998 ◽  
Vol 05 (06) ◽  
pp. 1287-1296 ◽  
Author(s):  
Th. Schmidt ◽  
S. Heun ◽  
J. Slezak ◽  
J. Diaz ◽  
K. C. Prince ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Electron Microscope ◽  
Synchrotron Radiation ◽  
Low Energy ◽  
Energy Electron ◽  
Structure Information ◽  
Low Energy Electron ◽  
Better Than

At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because it had very limited access to synchrotron radiation. Now the microscope is connected quasipermanently to the undulator beamline 6.2 at the storage ring ELETTRA, operating successfully since the end of 1996 under the name SPELEEM (Spectroscopic PhotoEmission and Low Energy Electron Microscope). The high brightness of the ELETTRA light source, together with an optimized instrument, results in a spatial resolution better than 25 nm and an energy resolution better than 0.5 eV in the XPEEM mode. The instrument can be used alternately for XPEEM, LEEM, LEED (low energy electron diffraction), MEM (mirror electron microscopy) and other imaging modes, depending upon the particular problem studied. The combination of these imaging modes allows a comprehensive characterization of the specimen. This is of particular importance when the chemical identification of structurar features is necessary for the understanding of a surface or thin film process. In addition, PED (photoelectron diffraction) and VPEAD (valence photoelectron angular distribution) of small selected areas give local atomic configuration and band structure information, respectively.

scholarly journals Characterization of thin film displacements in the electron microscope

2017 ◽  
Vol 111 (20) ◽  
pp. 203104
Author(s):  
Hidetaka Sawada ◽  
Reiner Ramlau ◽  
Christopher S. Allen ◽  
Angus I. Kirkland
Keyword(s):  
Thin Film ◽  
Electron Microscope

Microcharacterization of Heterogeneous Specimens Containing Tire Dust

1999 ◽  
Vol 589 ◽  
Author(s):  
Marina Camatini ◽  
GAI M Corbetta ◽  
Giovanini F Crosta ◽  
Tigran Dolukhanyan ◽  
Giampaolo Giuiani ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Analytical Electron Microscopy ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Transmission Electron ◽  
Debris Particles ◽  
Microscope Images ◽  
Analytical Electron ◽  
Diffraction Patterns

AbstractThis work is focused on dust or debris produced by the wear of tire tread. Two problems are addressed, which are solved by analytical electron microscopy (AEM): characterization of tire debris and identification of tire debris particles in a heterogeneous specimen. The characteristic morphology, microstructure and elemental composition of tire debris can all be determined by AEM. The scanning electron microscope (SEM) shows that the surface of a tire debris particle has a typical, warped structure with pores. The characteristic elements of tire rubber are S and Zn, which are detected by energy dispersive X ray (EDX) spectroscopy. The identification of rubber particles in heterogeneous debris containing talc and produced by a laboratory abrader is possible by the analytical SEM. Transmission electron microscope images, EDX spectra and selected area electron diffraction patterns characterize tire debris at the sub–micron scale, where the material can no longer be treated as homogeneous.

Clean Electron Microscope Substrate Films Used for Micrometeorite Collection and Study

1967 ◽  
Vol 25 ◽  
pp. 366-367
Author(s):  
D. M. Davies ◽  
R. Kemner ◽  
E. F. Fullam
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
High Altitude ◽  
Amyl Acetate ◽  
Temperature Variations ◽  
Film Forming ◽  
Film Specimen ◽  
Particulate Contaminants

All serious electron microscopists at one time or another have been concerned with the cleanliness and freedom from artifacts of thin film specimen support substrates. This is particularly important where there are relatively few particles of a sample to be found for study, as in the case of micrometeorite collections. For the deposition of such celestial garbage through the use of balloons, rockets, and aircraft, the thin film substrates must have not only all the attributes necessary for use in the electron microscope, but also be able to withstand rather wide temperature variations at high altitude, vibration and shock inherent in the collection vehicle's operation and occasionally an unscheduled violent landing.Nitrocellulose has been selected as a film forming material that meets these requirements yet lends itself to a relatively simple clean-up procedure to remove particulate contaminants. A 1% nitrocellulose solution is prepared by dissolving “Parlodion” in redistilled amyl acetate from which all moisture has been removed.

Electron Microscope Observations of Magnetic and Electric Effects

1970 ◽  
Vol 28 ◽  
pp. 430-431
Author(s):  
John Silcox
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Magnetic Image ◽  
Magnetic Effects ◽  
Ferromagnetic Films ◽  
Diffraction Contrast ◽  
Microscope Images ◽  
Electric Effects ◽  
Image Detail

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.

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