Comparison of scanning tunnelling microscopy and transmission electron microscopy image data of a microbial polysaccharide

1993 ◽  
Vol 48 (1-2) ◽  
pp. 197-201 ◽  
Author(s):  
M.J. Wilkins ◽  
M.C. Davies ◽  
D.E. Jackson ◽  
J.R. Mitchell ◽  
C.J. Roberts ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Image Data ◽  
Transmission Electron Microscopy Image ◽  
Scanning Tunnelling Microscopy ◽  
Microbial Polysaccharide ◽  
Transmission Electron ◽  
Microscopy Image ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy

Calculation and Analysis of Multifractal Spectrum of Sinter Surface

2013 ◽  
Vol 750-752 ◽  
pp. 2267-2270
Author(s):  
Zhi Min Cui ◽  
Rong Li Sang ◽  
Yuan Liang Li ◽  
Qing Jun Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Pore Structure ◽  
Multifractal Spectrum ◽  
Transmission Electron Microscopy Image ◽  
Structure Change ◽  
Electron Microscopy Image ◽  
Transmission Electron ◽  
Microscopy Image ◽  
Fractal Spectrum

Multifractal spectrums of sinter with different alkalinity were analyzed by multifractal software. The results show that sinter pore structure change from uniform to non-uniform with the improvement of alkalinity, Δα increases from 0.53 to 0.55. The structure of sinter pore is mainly microscopic by competition between macropores and micropores, Δf changes from 0.14 to-0.44. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum, which is consistent with transmission electron microscopy image.

Morphological Analysis of Particles in Transmission Electron Microscopy Image Using Image Processing

2013 ◽  
Vol 774-776 ◽  
pp. 1262-1266
Author(s):  
Manop Phankokkruad ◽  
Wacharawichanant Sirirat
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Transmission Electron Microscopy ◽  
Morphological Analysis ◽  
Transmission Electron Microscopy Image ◽  
Processing Method ◽  
New Materials ◽  
Manual Method ◽  
Transmission Electron ◽  
Microscopy Image

The analysis of material particles in the transmission electron microscopy (TEM) image is the most important in the development and synthesis of the new materials for application in many fields. Manual identification is the hard work, spent a lot of time and inaccurate method. To solve this problem, the image processing is proposed for automatically identifies the material particles boundary and size in TEM images in or order to extract the useful data. The image processing method has been experimented on variety of TEM images and very promising results have been achieved given more accuracy. Experimental results show that the proposed method gave the high adaptability, more accurate and rapidly than the manual method.

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