Nuclear reactor pulse calibration using a CdZnTe electro-optic radiation detector

2012 ◽  
Vol 70 (7) ◽  
pp. 1118-1120 ◽  
Author(s):  
Kyle A. Nelson ◽  
Jeffrey A. Geuther ◽  
James L. Neihart ◽  
Todd A. Riedel ◽  
Ronald A. Rojeski ◽  
...  
Keyword(s):  
Nuclear Reactor ◽  
Radiation Detector ◽  
Optic Radiation ◽  
Electro Optic ◽  
Pulse Calibration ◽  
Reactor Pulse

Nuclear reactor pulse tracing using a CdZnTe electro-optic radiation detector

2012 ◽  
Vol 680 ◽  
pp. 97-102 ◽  
Author(s):  
Kyle A. Nelson ◽  
Jeffrey A. Geuther ◽  
James L. Neihart ◽  
Todd A. Riedel ◽  
Ronald A. Rojeski ◽  
...  
Keyword(s):  
Nuclear Reactor ◽  
Radiation Detector ◽  
Optic Radiation ◽  
Electro Optic ◽  
Reactor Pulse

Inverted Pockels cell electro-optic response to nuclear reactor pulsing

2011 ◽  
Author(s):  
Kyle A. Nelson ◽  
Kevin R. Arpin ◽  
Jeffrey A. Geuther ◽  
James L. Neihart ◽  
Todd A. Riedel ◽  
...  
Keyword(s):  
Nuclear Reactor ◽  
Pockels Cell ◽  
Electro Optic

In situ TEM studies of irradiation effects for materials improvement

1991 ◽  
Vol 49 ◽  
pp. 452-453
Author(s):  
Charles W. Allen
Keyword(s):  
Nuclear Reactor ◽  
Austenitic Stainless Steels ◽  
High Energy ◽  
Point Of View ◽  
In Situ Tem ◽  
Irradiation Effects ◽  
Tem Analysis ◽  
Radiation Induced ◽  
Analytical Tools

Irradiation effects studies employing TEMs as analytical tools have been conducted for almost as many years as materials people have done TEM, motivated largely by materials needs for nuclear reactor development. Such studies have focussed on the behavior both of nuclear fuels and of materials for other reactor components which are subjected to radiation-induced degradation. Especially in the 1950s and 60s, post-irradiation TEM analysis may have been coupled to in situ (in reactor or in pile) experiments (e.g., irradiation-induced creep experiments of austenitic stainless steels). Although necessary from a technological point of view, such experiments are difficult to instrument (measure strain dynamically, e.g.) and control (temperature, e.g.) and require months or even years to perform in a nuclear reactor or in a spallation neutron source. Consequently, methods were sought for simulation of neutroninduced radiation damage of materials, the simulations employing other forms of radiation; in the case of metals and alloys, high energy electrons and high energy ions.

Eds Of Radioactive Particles By Self-Induced Fluorescence

1990 ◽  
Vol 48 (2) ◽  
pp. 238-239
Author(s):  
Gregory L. Finch ◽  
Richard G. Cuddihy
Keyword(s):  
Electron Beam Irradiation ◽  
Nuclear Reactor ◽  
X Rays ◽  
Reactor Accident ◽  
Internal Radiation ◽  
X Ray ◽  
External Sources ◽  
X Irradiation ◽  
Available Information ◽  
Individual Particles

The elemental composition of individual particles is commonly measured by using energydispersive spectroscopic microanalysis (EDS) of samples excited with electron beam irradiation. Similarly, several investigators have characterized particles by using external monochromatic X-irradiation rather than electrons. However, there is little available information describing measurements of particulate characteristic X rays produced not from external sources of radiation, but rather from internal radiation contained within the particle itself. Here, we describe the low-energy (< 20 KeV) characteristic X-ray spectra produced by internal radiation self-excitation of two general types of particulate samples; individual radioactive particles produced during the Chernobyl nuclear reactor accident and radioactive fused aluminosilicate particles (FAP). In addition, we compare these spectra with those generated by conventional EDS.Approximately thirty radioactive particle samples from the Chernobyl accident were on a sample of wood that was near the reactor when the accident occurred. Individual particles still on the wood were microdissected from the bulk matrix after bulk autoradiography.

Epitaxial ferroelectric thin films

1994 ◽  
Vol 52 ◽  
pp. 572-573
Author(s):  
S. G. Ghonge ◽  
E. Goo ◽  
R. Ramesh ◽  
R. Haakenaasen ◽  
D. K. Fork
Keyword(s):  
Single Crystal ◽  
Work Function ◽  
Nonvolatile Memory ◽  
Ferroelectric Properties ◽  
Electrical Contact ◽  
Memory Devices ◽  
Ferroelectric Films ◽  
Si Substrates ◽  
Electro Optic ◽  
Wide Range

Microstructure of epitaxial ferroelectric/conductive oxide heterostructures on LaAIO3(LAO) and Si substrates have been studied by conventional and high resolution transmission electron microscopy. The epitaxial films have a wide range of potential applications in areas such as non-volatile memory devices, electro-optic devices and pyroelectric detectors. For applications such as electro-optic devices the films must be single crystal and for applications such as nonvolatile memory devices and pyroelectric devices single crystal films will enhance the performance of the devices. The ferroelectric films studied are Pb(Zr0.2Ti0.8)O3(PLZT), PbTiO3(PT), BiTiO3(BT) and Pb0.9La0.1(Zr0.2Ti0.8)0.975O3(PLZT).Electrical contact to ferroelectric films is commonly made with metals such as Pt. Metals generally have a large difference in work function compared to the work function of the ferroelectric oxides. This results in a Schottky barrier at the interface and the interfacial space charge is believed to responsible for domain pinning and degradation in the ferroelectric properties resulting in phenomenon such as fatigue.

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