Storage-period dependent bias-stress instability of solution-processed amorphous indium–zinc-oxide thin-film transistors

2015 ◽  
Vol 15 ◽  
pp. S64-S68 ◽  
Author(s):  
Jung-Hye Kim ◽  
Joonwoo Kim ◽  
Soon Moon Jeong ◽  
Jaewook Jeong
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Storage Period ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Solution Processed ◽  
Bias Stress ◽  
Indium Zinc Oxide

Effect of Li-doping on low temperature solution-processed indium–zinc oxide thin film transistors

2017 ◽  
Vol 641 ◽  
pp. 19-23 ◽  
Author(s):  
Soo-Yeun Han ◽  
Manh-Cuong Nguyen ◽  
An Hoang Thuy Nguyen ◽  
Jae- Won Choi ◽  
Jung-Youn Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Solution Processed ◽  
Li Doping ◽  
Indium Zinc Oxide ◽  
Temperature Solution

Solution-processed laminated ZrO2/Al2O3 dielectric for low-voltage indium zinc oxide thin-film transistors

2016 ◽  
Vol 81 (2) ◽  
pp. 570-575 ◽  
Author(s):  
Sun Woong Han ◽  
Jee Ho Park ◽  
Young Bum Yoo ◽  
Keun Ho Lee ◽  
Kwang Hyun Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Low Voltage ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Solution Processed ◽  
Indium Zinc Oxide

P-23: Solution-processed Amorphous Lanthanum Indium Zinc Oxide Thin-film Transistors

2010 ◽  
Vol 41 (1) ◽  
pp. 1308 ◽  
Author(s):  
Doo Na Kim ◽  
Dong Lim Kim ◽  
Gun Hee Kim ◽  
Si Joon Kim ◽  
Hyun Jae Kim
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Solution Processed ◽  
Indium Zinc Oxide
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