The small-angle γ-band of the X-ray diffraction for nanographite powder and its approximation by full-profile analysis

2018 ◽  
Vol 5 (12) ◽  
pp. 26052-26057
Author(s):  
Nikita S. Saenko ◽  
Albert M. Ziatdinov
2004 ◽  
Vol 37 (6) ◽  
pp. 883-889 ◽  
Author(s):  
A. Steuwer ◽  
J. R. Santisteban ◽  
M. Turski ◽  
P. J. Withers ◽  
T. Buslaps

The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10−5. The measurements have been validated with complementary techniques or reference data.


2009 ◽  
Vol 42 (4) ◽  
pp. 660-672 ◽  
Author(s):  
Maja Buljan ◽  
Uroš V. Desnica ◽  
Nikola Radić ◽  
Goran Dražić ◽  
Zdeněk Matěj ◽  
...  

Defects of crystal structure in semiconductor nanocrystals embedded in an amorphous matrix are studied by X-ray diffraction and a full-profile analysis of the diffraction curves based on the Debye formula. A new theoretical model is proposed, describing the diffraction from randomly distributed intrinsic and extrinsic stacking faults and twin blocks in the nanocrystals. The application of the model to full-profile analysis of experimental diffraction curves enables the determination of the concentrations of individual defect types in the nanocrystals. The method has been applied for the investigation of self-organized Ge nanocrystals in an SiO2matrix, and the dependence of the structure quality of the nanocrystals on their deposition and annealing parameters was obtained.


2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Hongyang Dong ◽  
Keith T. Butler ◽  
Dorota Matras ◽  
Stephen W. T. Price ◽  
Yaroslav Odarchenko ◽  
...  

AbstractWe present Parameter Quantification Network (PQ-Net), a regression deep convolutional neural network providing quantitative analysis of powder X-ray diffraction patterns from multi-phase systems. The network is tested against simulated and experimental datasets of increasing complexity with the last one being an X-ray diffraction computed tomography dataset of a multi-phase Ni-Pd/CeO2-ZrO2/Al2O3 catalytic material system consisting of ca. 20,000 diffraction patterns. It is shown that the network predicts accurate scale factor, lattice parameter and crystallite size maps for all phases, which are comparable to those obtained through full profile analysis using the Rietveld method, also providing a reliable uncertainty measure on the results. The main advantage of PQ-Net is its ability to yield these results orders of magnitude faster showing its potential as a tool for real-time diffraction data analysis during in situ/operando experiments.


2012 ◽  
Vol 54 (10) ◽  
pp. 2073-2082 ◽  
Author(s):  
A. K. Samusev ◽  
I. S. Sinev ◽  
K. B. Samusev ◽  
M. V. Rybin ◽  
A. A. Mistonov ◽  
...  
Keyword(s):  

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  

2008 ◽  
Vol 39 (8) ◽  
pp. 1978-1984 ◽  
Author(s):  
S. Mahadevan ◽  
T. Jayakumar ◽  
B.P.C. Rao ◽  
Anish Kumar ◽  
K.V. Rajkumar ◽  
...  

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