Quantification of turbulent eddies in time-space and frequency domain for wave-current combined flow over side-wall roughness

2019 ◽  
Vol 186 ◽  
pp. 106080
Author(s):  
Sunil Hansda ◽  
Krishnendu Barman ◽  
Sayahnya Roy ◽  
Koustuv Debnath
Keyword(s):  
Frequency Domain ◽  
Side Wall ◽  
Wall Roughness ◽  
Turbulent Eddies ◽  
Combined Flow ◽  
Time Space

The Dependence of Demolding Characteristics on Side Wall Roughness of Mold in Thermal Imprint

2008 ◽  
Vol 128 (8) ◽  
pp. 325-330 ◽  
Author(s):  
Hiroaki Kawata ◽  
Junya Ishihara ◽  
Masayo Kayama ◽  
Masaaki Yasuda ◽  
Yoshihiko Hirai
Keyword(s):  
Side Wall ◽  
Wall Roughness

scholarly journals Investigation of Side Wall Roughness Effect on Optical Losses in a Multimode Si3N4 Waveguide Formed on a Quartz Substrate

Photonics ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 104
Author(s):  
Anastasia Yakuhina ◽  
Alexey Kadochkin ◽  
Vyacheslav Svetukhin ◽  
Dmitry Gorelov ◽  
Sergey Generalov ◽  
...  
Keyword(s):  
Optical Waveguides ◽  
Quartz Substrate ◽  
Side Wall ◽  
Wall Roughness ◽  
Roughness Parameters ◽  
Optical Losses ◽  
Waveguide Width ◽  
Integration Density ◽  
Frequency Domain Reflectometry ◽  
Multimode Operation

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.

Side-wall roughness of deep trenches in 1D and 2D periodic silicon structures fabricated by photoelectrochemical etching

2011 ◽  
Vol 8 (6) ◽  
pp. 1936-1940 ◽  
Author(s):  
E. V. Astrova ◽  
G. V. Fedulova ◽  
Yu. A. Zharova ◽  
E. V. Gushchina
Keyword(s):  
Side Wall ◽  
Wall Roughness ◽  
Photoelectrochemical Etching ◽  
Silicon Structures

Side wall roughness in ultradeep X-ray lithography

2002 ◽  
Vol 9 (1-2) ◽  
pp. 130-132 ◽  
Author(s):  
N. Moldovan ◽  
D. C. Mancini ◽  
R. Divan ◽  
O. V. Makarova ◽  
A. Peele ◽  
...  
Keyword(s):  
Side Wall ◽  
Wall Roughness ◽  
X Ray

Channel Estimating Based on Space-Time-Frequency Pilot for MIMO-OFDM

2012 ◽  
Vol 429 ◽  
pp. 179-185
Author(s):  
Hui Liu ◽  
Jing Shan Jiao ◽  
Fu Chun Zhang ◽  
Ling Zhou
Keyword(s):  
Frequency Domain ◽  
Time Domain ◽  
Space Time ◽  
Three Dimensions ◽  
Space Domain ◽  
Time Frequency ◽  
Time Space ◽  
Mimo Ofdm ◽  
The Time Domain ◽  
Inverse Operation

The pilots that are transmitted by different transmitting antennas must be orthogonal after being shifted. So the time domain channel estimating solution is deduced through LS based on the MIMO-OFDM channel estimating model. The time domain solution need the inverse operation of matrix, and its operating quantity is large. So the three dimensions pilot based on space domain, time domain and frequency domain is designed. The method need not the inverse operation of matrix for the time domain channel estimating solution and can reduce the complexity of channel estimating and make the channel estimating error minimum. It is shown from the simulation that the channel estimating method of this paper based on space domain, time space and frequency domain pilot has better MSE and BER performances compared with the traditional LS algorithm and the document algorithm.

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