Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry

2019 ◽  
Vol 431 ◽  
pp. 181-186 ◽  
Author(s):  
Jungjae Park ◽  
Jaeseok Bae ◽  
Jong-Ahn Kim ◽  
Jonghan Jin
1998 ◽  
Author(s):  
Stephen R. Uhlhorn ◽  
Fabrice Manns ◽  
Hassan Tahi ◽  
Pascal O. Rol ◽  
Jean-Marie A. Parel

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