Experimental study on fluence rate response of LaBr 3 to pulsed X-rays

2018 ◽  
Vol 114 ◽  
pp. 8-11 ◽  
Author(s):  
Yicheng Yi ◽  
Zhaohui Song ◽  
Lu Yi ◽  
Xingyin Guan ◽  
Xiang Chen ◽  
...  
2008 ◽  
Vol 64 (3) ◽  
pp. 335-341 ◽  
Author(s):  
Osamu Nakamura ◽  
Giichirou Nakaya ◽  
Susumu Ogashiwa ◽  
Akio Hashimoto ◽  
Masasya Kondou ◽  
...  
Keyword(s):  

2008 ◽  
Vol 55 (5) ◽  
pp. 2637-2642 ◽  
Author(s):  
Sergio J. C. do Carmo ◽  
Filipa I. G. M. Borges ◽  
Filipa L. R. Vinagre ◽  
Carlos A. N. Conde
Keyword(s):  

2002 ◽  
Vol 35 (6) ◽  
pp. 684-688 ◽  
Author(s):  
Y. D. Wang ◽  
X.-L. Wang ◽  
A. D. Stoica ◽  
J. D. Almer ◽  
U. Lienert ◽  
...  

High-energy synchrotron diffraction offers great potential for experimental study of recrystallization kinetics. Measurements on partially recrystallized samples using a monochromatic high-energy synchrotron beam show that recrystallized grains generate sharp diffraction spots, whereas the intensity from the deformed matrix varies smoothly along the Debye–Scherrer rings. Based on these observations, a method has been developed to separate the recrystallization texture components from those originating from the deformation matrix. The validity of this method is demonstrated with partially recrystallized interstitial-free steel.


2004 ◽  
Vol 47 (2) ◽  
pp. 260-263 ◽  
Author(s):  
E. O. Baronova ◽  
R. V. Garanin ◽  
N. V. Zhidkov ◽  
M. M. Stepanenko ◽  
N. A. Suslov

2014 ◽  
Vol 48 (2) ◽  
pp. 025205 ◽  
Author(s):  
P O Kochkin ◽  
A P J van Deursen ◽  
U Ebert
Keyword(s):  

2012 ◽  
Vol 45 (42) ◽  
pp. 425202 ◽  
Author(s):  
P O Kochkin ◽  
C V Nguyen ◽  
A P J van Deursen ◽  
U Ebert
Keyword(s):  

1995 ◽  
Vol 13 (1) ◽  
pp. 129-134 ◽  
Author(s):  
S.P. Moo ◽  
C.S. Wong

Some results of an experimental study of the hard X rays emitted from a 15-kV, 3-kJ plasma focus operated in argon are reported. The temporal evolution of the hard X rays detected by a plastic scintillator-photomultiplier detector and the voltage across the focus tube measured by a resistive voltage divider are simultaneously recorded on a two-channel digitizing oscilloscope. Metal absorbers of various thicknesses are used to provide some indications of the energies of the X rays. When the time delay of the detector system with respect to the anode voltage is taken into account, the hard X rays are observed to be emitted about 15 ns before the peak of the anode voltage and last for about 100 ns. There are two periods of emission, the X rays emitted in the first period being more intense, more energetic, and more directional than the X rays emitted in the second period. The X rays are attributed to the bombardment of the anode by energetic electrons generated in the pinch and the disruption phases of the focus.


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