The hydroxylation of passive oxide films on X-70 steel by dissolved hydrogen studied by nuclear reaction analysis, Auger electron spectroscopy, X-ray photoelectron spectroscopy and secondary ion mass spectroscopy

Nuclear Reaction ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Nuclear Reaction Analysis ◽

X Ray ◽

Dissolved Hydrogen ◽

A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)

Surface Science ◽

10.1016/0039-6028(75)90160-0 ◽

1975 ◽

Vol 53 (1) ◽

pp. 636-648 ◽

Cited By ~ 12

Author(s):

M. Gettings ◽

J.P. Coad

Keyword(s):

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Pure Metal ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Preliminary Study ◽

X-ray photoelectron spectroscopy, X-ray excited Auger electron spectroscopy and time-of-flight secondary ion mass spectroscopy characterization of carbon fibres activated by d.c. corona discharge at ambient pressure and temperature

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(97)00068-6 ◽

1997 ◽

Vol 85 (3) ◽

pp. 179-191 ◽

Cited By ~ 18

Author(s):

E Desimoni ◽

A.M Salvi ◽

F Langerame ◽

J.F Watts

Keyword(s):

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ambient Pressure ◽

Carbon Fibres ◽

X Ray ◽

The study of hydrogen segregation on Zr(0001) and Zr(1010) surfaces by static secondary ion mass spectroscopy, work function, Auger electron spectroscopy and nuclear reaction analysis

Journal of Alloys and Compounds ◽

10.1016/0925-8388(95)01847-6 ◽

1995 ◽

Vol 231 (1-2) ◽

pp. 354-363 ◽

Cited By ~ 31

Author(s):

C.-S. Zhang ◽

B. Li ◽

P.R. Norton

Keyword(s):

Work Function ◽

Nuclear Reaction ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Nuclear Reaction Analysis ◽

Secondary Ion Mass Spectroscopy ◽

Hydrogen Segregation ◽

X-ray Photoelectron Spectroscopy, Photoelectron Energy Loss Spectroscopy, X-ray Excited Auger Electron Spectroscopy, and Time-of-Flight−Secondary Ion Mass Spectroscopy Studies of Asphaltenes from Doba−Chad Heavy Crude Hydrovisbreaking

Energy & Fuels ◽

10.1021/ef049951e ◽

2004 ◽

Vol 18 (6) ◽

pp. 1744-1756 ◽

Cited By ~ 15

Author(s):

Faïçal Larachi ◽

Soumaïne Dehkissia ◽

Alain Adnot ◽

Esteban Chornet

Keyword(s):

Energy Loss ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Heavy Crude ◽

Spectroscopy Studies ◽

Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Cited By ~ 44

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Ion Mass Spectrometry ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

An Auger electron spectroscopy, x-ray photoelectron spectroscopy, secondary ion mass spectrometry and bulk analysis of pyrolytic boron nitride crucibles after vacuum baking

10.1116/1.583511 ◽

1986 ◽

Vol 4 (6) ◽

pp. 1310 ◽

Cited By ~ 12

Author(s):

F. A. Chambers

Keyword(s):

Mass Spectrometry ◽

Boron Nitride ◽

Electron Spectroscopy ◽

Auger Electron ◽

Bulk Analysis ◽

X Ray ◽

ChemInform Abstract: SURFACE ANALYSIS: X-RAY PHOTOELECTRON SPECTROSCOPY, AUGER ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS SPECTROMETRY

Chemischer Informationsdienst ◽

10.1002/chin.198249370 ◽

1982 ◽

Vol 13 (49) ◽

Author(s):

N. H. TURNER ◽

R. J. COLTON

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Ion Mass Spectrometry ◽

American society for testing and materials. Standard guide for specimen handling in Auger electron spectroscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry (E1078-90)

Surface and Interface Analysis ◽

10.1002/sia.740171311 ◽

1991 ◽

Vol 17 (13) ◽

pp. 965-971 ◽

Cited By ~ 2

Keyword(s):

Mass Spectrometry ◽

Electron Spectroscopy ◽

Auger Electron ◽

Specimen Handling ◽

X Ray ◽

American Society ◽

Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00269a026 ◽

1984 ◽

Vol 56 (5) ◽

pp. 373-416 ◽

Cited By ~ 45

Author(s):

Noel H. Turner ◽

Brett I. Dunlap ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Ion Mass Spectrometry ◽

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis