Secondary ion mass spectrometry and atomic force microscopy analysis of silver-doped diamond-like carbon films on titanium alloy (Ti6Al4V) for possible biomedical application

2021 ◽  
Vol 719 ◽  
pp. 138487
Author(s):  
A. de Oliveira ◽  
F.G. Placias ◽  
A.S. da Silva Sobrinho ◽  
D.M.G. Leite ◽  
W. Miyakawa ◽  
...  
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Biomedical Application ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Atomic Force Microscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Titanium Alloy Ti6al4v ◽  
Secondary Ion

TUNING PROPERTIES AND MORPHOLOGY IN HIGH VINYL CONTENT SBS BLOCK COPOLYMER, A THERMOPLASTIC ELASTOMER VIA THIOL-ENE MODIFICATION

2017 ◽  
Vol 90 (3) ◽  
pp. 550-561 ◽  
Author(s):  
Prithwiraj Mandal ◽  
Siva Ponnupandian ◽  
Soumyadip Choudhury ◽  
Nikhil K. Singha
Keyword(s):  
Block Copolymer ◽  
Thermoplastic Elastomer ◽  
Atomic Force Microscopy Analysis ◽  
Ene Reaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Styrene Butadiene Styrene ◽  
Styrene Butadiene ◽  
Butadiene Styrene

ABSTRACT Thiol-ene modification of high vinyl content thermoplastic elastomeric styrene butadiene styrene (SBS) block copolymer (BCP) was carried out using different thiolating agents in toluene at 70 °C. 1H NMR analysis confirmed the participation of vinyl double bond in the thiol-ene modification reaction of SBS. Surface morphology of the block copolymers evaluated by atomic force microscopy analysis showed higher roughness after the thiol-ene reaction. The thiol-modified SBS block copolymer showed better adhesion strength and oil resistance properties than the pristine SBS.

Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition

2001 ◽  
Vol 79 (19) ◽  
pp. 3158-3160 ◽  
Author(s):  
J. Carrey ◽  
K. Bouzehouane ◽  
J.-M. George ◽  
C. Ceneray ◽  
A. Fert ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Aluminum Oxide ◽  
Atomic Force Microscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Oxide Barrier

Atomic force microscopy analysis of wool fibre surfaces in air and under water

Micron ◽  
2000 ◽  
Vol 31 (6) ◽  
pp. 659-667 ◽  
Author(s):  
J.A.A. Crossley ◽  
C.T. Gibson ◽  
L.D. Mapledoram ◽  
M.G. Huson ◽  
S. Myhra ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Wool Fibre ◽  
Atomic Force Microscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis

Latest developments for microstructural and chemical characterization of diffusion bonding in superplastic 8090 Al–Li alloys

1996 ◽  
Vol 11 (1) ◽  
pp. 63-71 ◽  
Author(s):  
A. Ureña ◽  
J. M. Gómez de Salazar ◽  
J. J. Martín ◽  
J. Quiñones
Keyword(s):  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Mixed Oxides ◽  
Chemical Characterization ◽  
Bond Line ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bond Interface ◽  
Secondary Ion

This paper describes a new application of two complementary surface characterization techniques to study solid-state bonding in an Al–Li alloy. Through the two mentioned techniques, Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS), important findings about what takes place in the bond interface have been determined. These findings enclose both the formation of discontinuous mixed oxides and the evolution of Li through the bond line and into theadjacent diffusion affected zones. Homogenization of Li and Cu alloyelements has been detected even in those cases where a metallic interlayer was used to favor the union.

An atomic force microscopy analysis of yeast mutants defective in cell wall architecture

Yeast ◽  
2010 ◽  
Vol 27 (8) ◽  
pp. 673-684 ◽  
Author(s):  
Etienne Dague ◽  
Rajaa Bitar ◽  
Hubert Ranchon ◽  
Fabien Durand ◽  
Hélène Martin Yken ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Wall ◽  
Atomic Force Microscopy Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis ◽  
Yeast Mutants ◽  
Cell Wall Architecture
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