First experimental test of a new monochromated and aberration-corrected 200kV field-emission scanning transmission electron microscope

2006 ◽  
Vol 106 (11-12) ◽  
pp. 963-969 ◽  
Author(s):  
T. Walther ◽  
E. Quandt ◽  
H. Stegmann ◽  
A. Thesen ◽  
G. Benner
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