Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images
2018 ◽
Vol 4
(1)
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2000 ◽
Vol 49
(6)
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pp. 753-759
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2006 ◽
Vol 223
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pp. 172-178
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2011 ◽
Vol 50
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pp. 126603
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2009 ◽
Vol 15
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pp. 251-258
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