Quantitative acoustic microscopy for characterization of the interface strength of diamond-like carbon thin films

1997 ◽  
Vol 300 (1-2) ◽  
pp. 42-50 ◽  
Author(s):  
S. Parthasarathi ◽  
B.R. Tittmann ◽  
R.J. Ianno
1991 ◽  
Vol 15 (S_2_PMRC_91) ◽  
pp. S2_751-756 ◽  
Author(s):  
Atsushi SUZUKI ◽  
Yoichi HOSHI ◽  
Tsutomu ISOBE ◽  
Jack H. JUDY

2010 ◽  
Vol 518 (21) ◽  
pp. S42-S45 ◽  
Author(s):  
Y.T. Pei ◽  
X.L. Bui ◽  
J.Th.M. De Hosson

2015 ◽  
Vol 589 ◽  
pp. 457-464 ◽  
Author(s):  
L.L. Zhang ◽  
Q. Yang ◽  
Y. Tang ◽  
L. Yang ◽  
C. Zhang ◽  
...  

2008 ◽  
Vol 17 (4-5) ◽  
pp. 709-712
Author(s):  
Ivan Ohlídal ◽  
David Nečas ◽  
Vilma Buršíková ◽  
Daniel Franta ◽  
Miloslav Ohlídal

2000 ◽  
Vol 154-155 ◽  
pp. 482-484 ◽  
Author(s):  
Kyung-Suk Shim ◽  
Sung-Min Kim ◽  
Sang Hyuck Bae ◽  
Sang Yeol Lee ◽  
Hae-suk Jung ◽  
...  

Author(s):  
J. Kulik ◽  
Y. Lifshitz ◽  
G.D. Lempert ◽  
S. Rotter ◽  
J.W. Rabalais ◽  
...  

Carbon thin films with diamond-like properties have generated significant interest in condensed matter science in recent years. Their extreme hardness combined with insulating electronic characteristics and high thermal conductivity make them attractive for a variety of uses including abrasion resistant coatings and applications in electronic devices. Understanding the growth and structure of such films is therefore of technological interest as well as a goal of basic physics and chemistry research. Recent investigations have demonstrated the usefulness of energetic ion beam deposition in the preparation of such films. We have begun an electron microscopy investigation into the microstructure and electron energy loss spectra of diamond like carbon thin films prepared by energetic ion beam deposition.The carbon films were deposited using the MEIRA ion beam facility at the Soreq Nuclear Research Center in Yavne, Israel. Mass selected C+ beams in the range 50 to 300 eV were directed onto Si {100} which had been etched with HF prior to deposition.


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