scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

2008 ◽  
Vol 516 (22) ◽  
pp. 8022-8028 ◽  
Author(s):  
V. Holý ◽  
K. Mundboth ◽  
C. Mokuta ◽  
T.H. Metzger ◽  
J. Stangl ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

scholarly journals X-ray diffraction and optical characterization of interdiffusion in self-assembled InAs/GaAs quantum-dot superlattices

2000 ◽  
Vol 77 (14) ◽  
pp. 2130-2132 ◽  
Author(s):  
S. J. Xu ◽  
H. Wang ◽  
Q. Li ◽  
M. H. Xie ◽  
X. C. Wang ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled ◽  
Gaas Quantum Dot

Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

1998 ◽  
Vol 2 (1-4) ◽  
pp. 789-793 ◽  
Author(s):  
A.A Darhuber ◽  
V Holy ◽  
P Schittenhelm ◽  
J Stangl ◽  
I Kegel ◽  
...  
Keyword(s):  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled
Sign in / Sign up

Export Citation Format

Share Document