Status of the 4W1C beamline and the diffuse scattering experimental station at the Beijing Synchrotron Radiation Facility

AbstractThis article gives a complete account of the research in synchrotron radiation powder diffractometry (SRPD) conducted at DESY/Hasylab between 1981 and 1992 and incorporates an extensive bibliography on SRPD in general. A detailed description of the experimental station for powder diffraction established in fall 1988 at beamline B2 of HASYLAB is given and selected examples of research conducted to date are reviewed to demonstrate its capabilities and potential. Aspects of instrument availability and beamtime allocation are entertained in the concluding remarks. References have been selected such that maximum coverage of the field is achieved with a minimum of citations and the list is hopefully complete with respect to the retrievable literature pertinent to the development of synchrotron powder diffractometry at Hasylab. Papers covering methodical aspects of data analysis and more general aspects of SRPD, however, have not been included.

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Diffuse x-ray scattering from InGaAs/GaAs quantum dots

MRS Proceedings ◽

10.1557/proc-799-z6.6/n8.6/t6.6 ◽

2003 ◽

Vol 799 ◽

Author(s):

Rolf Köhler ◽

Daniil Grigoriev ◽

Michael Hanke ◽

Martin Schmidbauer ◽

Peter Schäfer ◽

...

Keyword(s):

Quantum Dots ◽

Synchrotron Radiation ◽

Diffuse Scattering ◽

Data Evaluation ◽

X Ray ◽

X Ray Scattering ◽

Gaas Matrix ◽

Wetting Layers ◽

Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

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Fabrication and Testing of Hard X-Ray Hourglass Lenses

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.60-61.175 ◽

2009 ◽

Vol 60-61 ◽

pp. 175-179

Author(s):

Jing Qiu Liang ◽

Yan Qing Zhu ◽

Nai Di Cui ◽

Zhong Zhu Liang ◽

Zhi Chun Le ◽

...

Keyword(s):

Synchrotron Radiation ◽

Relative Intensity ◽

One Dimension ◽

Structure Parameters ◽

X Ray ◽

Beijing Synchrotron Radiation Facility ◽

Exposure Technique

Based on the refraction theory of the lens, the SU-8 photoresist hard X-ray hourglass lenses with three different structure parameters are fabricated. The mask-back exposure technique is introduced to fabricate the lenses. The focusing performance of this device is tested at Beijing Synchrotron Radiation Facility (BSRF). At the distance of 1.65m from the lenses, an obviously focusing performance in one dimension is observed. The relative intensity of the lenses with the largest gain is about 217.7, the gain of the lens is about 1.15, and the dimension of the focus is about 33µm. The focusing performance of this device can be improved through the developing of the mask-back exposure technique.

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