scholarly journals Scanning force microscopy of heavy-ion tracks in lithium fluoride

1998 ◽  
Vol 146 (1-4) ◽  
pp. 393-398 ◽  
Author(s):  
A. Müller ◽  
R. Neumann ◽  
K. Schwartz ◽  
C. Trautmann
Keyword(s):  
Lithium Fluoride ◽  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Scanning Force

Scanning force microscopy of heavy-ion tracks

1993 ◽  
Vol 126 (1-4) ◽  
pp. 213-216 ◽  
Author(s):  
J. Ackermann ◽  
S. Grafström ◽  
M. Neitzert ◽  
R. Neumann ◽  
C. Trautmann ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Scanning Force

Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum

1997 ◽  
pp. 261-267 ◽  
Author(s):  
J. Ackermann ◽  
S. Grafström ◽  
T. Hagen ◽  
J. Kowalski ◽  
R. Neumann ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Ion Tracks ◽  
Scanning Force

scholarly journals Heavy-ion induced modification of lithium fluoride observed by scanning force microscopy

1998 ◽  
Vol 66 (7) ◽  
pp. S1147-S1150 ◽  
Author(s):  
A. Müller ◽  
R. Neumann ◽  
K. Schwartz ◽  
T. Steckenreiter ◽  
C. Trautmann
Keyword(s):  
Lithium Fluoride ◽  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Scanning Force

Heavy-ion induced defects in phlogopite imaged by scanning force microscopy

2002 ◽  
Vol 158-159 ◽  
pp. 439-443 ◽  
Author(s):  
M Lang ◽  
U.A Glasmacher ◽  
B Moine ◽  
C Müller ◽  
R Neumann ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Scanning Force ◽  
Induced Defects
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