Influence of sputtering conditions on the structure and properties of Ti–Si–N thin films prepared by r.f.-reactive sputtering
2003 ◽
Vol 174-175
◽
pp. 261-265
◽
2019 ◽
Vol 37
(5)
◽
pp. 051508
◽
1990 ◽
Vol 5
(4)
◽
pp. 677-679
◽
2008 ◽
Vol 354
(19-25)
◽
pp. 2853-2857
◽
2021 ◽
Vol 1750
◽
pp. 012082