Infrared and Raman spectroscopic investigation of thin films of AlN and SiC on Si substrates

1999 ◽  
Vol 19 (2) ◽  
pp. 205-211 ◽  
Author(s):  
H. Hobert ◽  
H.H. Dunken ◽  
J. Meinschien ◽  
H. Stafast
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