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Infrared and Raman spectroscopic investigation of thin films of AlN and SiC on Si substrates
Vibrational Spectroscopy
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10.1016/s0924-2031(98)00076-9
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1999
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Vol 19
(2)
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pp. 205-211
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Cited By ~ 25
Author(s):
H. Hobert
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H.H. Dunken
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J. Meinschien
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H. Stafast
Keyword(s):
Thin Films
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Spectroscopic Investigation
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Raman Spectroscopic
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Si Substrates
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