Advances in microscopy of polymers: A FESEM and STM study
Microscopy has played a major role in establishing structure-process-property relationships in the research and development of polymeric materials. With advances in electron microscopy instrumentation (e.g., field emission SEM - FESEM) and the invention of new scanning probe microscopes (e.g., scanning tunneling microscope - STM), resolution of structures or morphologies down to the nanometer scale can be achieved with ease. This paper will focus on the application of FESEM and STM in order to understand the structure of commercial polymeric materials. Characterization of polymers using other microscopy techniques such as TEM, thermal optical microscopy and atomic force microscopy (AFM) will also be discussed.The polymeric materials evaluated in this study include membranes, liquid crystalline polymer (LCP) fibers, multiphase polymer blends and polymer films or coatings. In order to minimize beam damage and maximize contrast for surface detail in beam sensitive polymers, low voltage SEM (LVSEM) was performed on a JEOL 840F field emission SEM.