Microstructural examination of modified yttria stabilized zirconia by EM analytical techniques
1986 ◽
Vol 44
◽
pp. 842-843
Keyword(s):
Yttria stabilized zirconia (YSZ) has become a significant technological material due to its high ionic conductivity, chemical inertness, and good mechanical properties. Temperatures on the order of 1700°C are required, however, to densify YSZ to the degree necessary for good electrical and mechanical properties. A technique for lowering the densification temperature is the addition of small amounts of material which facilitate the formation of a liquid phase at comparatively low temperatures. In this study, sintered microstructures obtained from the use of Al2O3 as a sintering aid were examined with scanning, transmission, and scanning transmission microscopy (SEM, TEM, and STEM).
2013 ◽
Vol 591
◽
pp. 245-248
◽
2014 ◽
Vol 309
◽
pp. 271-277
◽
Keyword(s):
Keyword(s):
2019 ◽
Vol 45
(17)
◽
pp. 23740-23749
◽
2000 ◽
Vol 284
(1-2)
◽
pp. 41-50
◽