Characterization of Nanodevices by using In-Situ TEM-STM

2008 ◽  
Vol 14 (S2) ◽  
pp. 20-21 ◽  
Author(s):  
J Kim ◽  
D Cha ◽  
SY Park ◽  
MJ Kim
Keyword(s):  
New Mexico ◽  
In Situ Tem

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals In Situ TEM Characterization of Electrochemical Systems

2011 ◽  
Vol 17 (S2) ◽  
pp. 1572-1573 ◽  
Author(s):  
K Noh ◽  
L Sun ◽  
X Chen ◽  
J Wen ◽  
S Dillon
Keyword(s):  
In Situ Tem ◽  
Electrochemical Systems ◽  
Tem Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

In situ TEM characterization of interfacial reaction in Sn–3.5Ag/electroless Ni(P) solder joint

2011 ◽  
Vol 64 (7) ◽  
pp. 597-600 ◽  
Author(s):  
Han-Byul Kang ◽  
Jee-Hwan Bae ◽  
Jeong-Won Yoon ◽  
Seung-Boo Jung ◽  
Jongwoo Park ◽  
...  
Keyword(s):  
Solder Joint ◽  
Interfacial Reaction ◽  
In Situ Tem ◽  
Tem Characterization ◽  
Electroless Ni

In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device

2017 ◽  
Vol 24 (4) ◽  
pp. 2045-2049 ◽  
Author(s):  
Xiao Zhang ◽  
Yang Yang ◽  
Fangfang Xu ◽  
Tie Li ◽  
Yuelin Wang
Keyword(s):  
Mechanical Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mems Device

Nanomeasurements of individual carbon nanotubes by in situ TEM

2000 ◽  
Vol 72 (1-2) ◽  
pp. 209-219 ◽  
Author(s):  
Z. L. Wang ◽  
P. Poncharal ◽  
W. A. de Heer
Keyword(s):  
Carbon Nanotubes ◽  
Complete Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mechanical And Electrical Properties ◽  
Novel Approach ◽  
Transmission Electron ◽  
Electron Field

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in situ transmission electron microscopy (TEM). The technique is powerful in a way that it can be directly correlated to the atomic-scale microstructure of the carbon nanotube with its physical properties, thus providing a complete characterization of the nanotube. Applications of the technique will be demonstrated in measurements of the mechanical properties, the electron field emission, and the ballistic quantum conductance of individual carbon nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f = 10-15 ).

Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution

2008 ◽  
Vol 14 (S2) ◽  
pp. 790-791
Author(s):  
XF Zhang
Keyword(s):  
New Mexico ◽  
Atomic Resolution ◽  
In Situ Tem ◽  
Sample Holder ◽  
Interaction Studies

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement

2008 ◽  
Vol 14 (S2) ◽  
pp. 402-403 ◽  
Author(s):  
SY Park ◽  
D Cha ◽  
O Lourie ◽  
MJ Kim
Keyword(s):  
New Mexico ◽  
Electrical Measurement ◽  
In Situ Tem

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys

2018 ◽  
Vol 24 (S1) ◽  
pp. 12-13
Author(s):  
Jiancun Rao ◽  
Xiaodong Zhang ◽  
Vasek Ocelik ◽  
David Vainchtein ◽  
Jeff T.M. De Hosson ◽  
...  
Keyword(s):  
In Situ Tem ◽  
Novel Technique ◽  
Tem Characterization
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