scholarly journals Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?,

2009 ◽  
Vol 15 (S2) ◽  
pp. 458-459 ◽  
Author(s):  
NJ Zaluzec
Keyword(s):  
Single Atom ◽  
Atom Detection ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Single-atom detection by SONRES

1978 ◽  
Vol 14 (2) ◽  
pp. 121-125 ◽  
Author(s):  
J. Gelbwachs ◽  
C. Klein ◽  
J. Wessel
Keyword(s):  
Single Atom ◽  
Atom Detection

Prospects for single atom location and identification with aberration-corrected STEM

2018 ◽  
pp. 523-532
Author(s):  
A R Lupini ◽  
M Varela ◽  
A Y Borisevich ◽  
Y Peng ◽  
S J Pennycook
Keyword(s):  
Single Atom ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals EELS quantification near the single-atom detection level

1991 ◽  
Vol 2 (2-3) ◽  
pp. 257-267 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Claudie Mory ◽  
Marcel Tence ◽  
Christian Colliex
Keyword(s):  
Single Atom ◽  
Detection Level ◽  
Atom Detection

Nano-precipitates made of atomic pillars revealed by single atom detection in a Mg-Nd alloy

2012 ◽  
Vol 100 (14) ◽  
pp. 141906 ◽  
Author(s):  
W. Lefebvre ◽  
V. Kopp ◽  
C. Pareige
Keyword(s):  
Single Atom ◽  
Atom Detection

Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage FEG-STEM

1997 ◽  
Vol 3 (S2) ◽  
pp. 965-966
Author(s):  
M. Watanabe ◽  
D. W. Ackland ◽  
D. B. Williams
Keyword(s):  
Spatial Resolution ◽  
Single Atom ◽  
Acquisition Time ◽  
Analytical Sensitivity ◽  
X Ray ◽  
Quantitative Microanalysis ◽  
Analytical Electron ◽  
Atom Detection ◽  
Electron Microscopes ◽  
Image Position

One of the ultimate objectives for energy-dispersive X-ray spectrometry (EDS) in the analytical electron microscope (AEM) is single-atom detection in thin specimens, as well as quantitative microanalysis with high accuracy approaching ±1% relative. In order to realize the single-atom analysis, the design of the AEM has to be optimized with respect to improvements in spatial resolution and detectability limits. The detectability limit, as defined by the minimum mass fraction (MMF), is given by:where P is the peak intensity of interest, (P/B) is the peak-to-background ratio for that peak, and r is the acquisition time. To improve the sensitivity for analysis, any or all of the variables P, (P/B), and τ should be increased. Intermediate-voltage analytical electron microscopes combined with high brightness field-emission gun (FEG) are expected to improve the MMF, while maintaining high spatial resolution. Additionally, the MMF should also be improved by maximizing the solid angle of X-ray collection.

High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K van Benthem ◽  
GS Painter ◽  
PF Becher ◽  
CI Contescu ◽  
NC Gallego ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Atom ◽  
Aberration Corrected Stem ◽  
High Resolution Microscopy ◽  
Aberration Corrected
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