Highly Sensitive Terahertz Thin-Film Total Internal Reflection Spectroscopy Reveals in Situ Photoinduced Structural Changes in Methylammonium Lead Halide Perovskites

Qiushuo Sun; Xudong Liu; Jie Cao; Rayko I. Stantchev; Yang Zhou; Xuequan Chen; Edward P. J. Parrott; James Lloyd-Hughes; Ni Zhao; Emma Pickwell-MacPherson

doi:10.1021/acs.jpcc.8b05695

Highly Sensitive Terahertz Thin-Film Total Internal Reflection Spectroscopy Reveals in Situ Photoinduced Structural Changes in Methylammonium Lead Halide Perovskites

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.8b05695 ◽

2018 ◽

Vol 122 (30) ◽

pp. 17552-17558 ◽

Cited By ~ 11

Author(s):

Qiushuo Sun ◽

Xudong Liu ◽

Jie Cao ◽

Rayko I. Stantchev ◽

Yang Zhou ◽

...

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Structural Changes ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Highly Sensitive ◽

Halide Perovskites ◽

Internal Reflection Spectroscopy ◽

Lead Halide

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Observation and control of thin-film defects using in-situ total-internal-reflection microscopy

10.1117/12.60111 ◽

1992 ◽

Cited By ~ 4

Author(s):

Forrest L. Williams ◽

Gary A. Peterson, Jr. ◽

Reed A. Schmell ◽

Charles K. Carniglia

Keyword(s):

Thin Film ◽

Total Internal Reflection ◽

Internal Reflection ◽

Total Internal Reflection Microscopy ◽

And Control

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Study of microporous membranes using frustrated total internal reflection spectroscopy

Journal of Optical Technology ◽

10.1364/jot.70.000022 ◽

2003 ◽

Vol 70 (1) ◽

pp. 22 ◽

Cited By ~ 3

Author(s):

B. Z. Volchek ◽

S. V. Kononova ◽

E. N. Vlasova ◽

R. K. Mamedov ◽

K. A. Mikhalev

Keyword(s):

Total Internal Reflection ◽

Internal Reflection ◽

Microporous Membranes ◽

Reflection Spectroscopy ◽

Frustrated Total Internal Reflection ◽

Internal Reflection Spectroscopy

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Analysis of Interfacial Water at a Hydrophilic Silicon Surface by in-Situ FTIR/Internal Reflection Spectroscopy

Langmuir ◽

10.1021/la950340b ◽

1996 ◽

Vol 12 (17) ◽

pp. 4176-4184 ◽

Cited By ~ 49

Author(s):

M. R. Yalamanchili ◽

A. A. Atia ◽

J. D. Miller

Keyword(s):

Silicon Surface ◽

Internal Reflection ◽

Interfacial Water ◽

In Situ Ftir ◽

Reflection Spectroscopy ◽

Internal Reflection Spectroscopy

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Measurement of ordered associate of protonated tetraphenylporphine formed at toluene/aqueous H2SO4 interface by attenuated total internal reflection spectroscopy with polarized light

Analytica Chimica Acta ◽

10.1016/j.aca.2005.09.004 ◽

2006 ◽

Vol 556 (1) ◽

pp. 112-120 ◽

Cited By ~ 6

Author(s):

Satoshi Tsukahara

Keyword(s):

Total Internal Reflection ◽

Polarized Light ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Attenuated Total Internal Reflection ◽

Internal Reflection Spectroscopy

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Multiple destruction of total internal reflection spectroscopy used in the study of surface layers of glass

Journal of Applied Spectroscopy ◽

10.1007/bf00613891 ◽

1974 ◽

Vol 20 (3) ◽

pp. 341-344

Author(s):

V. M. Zolotarev ◽

V. A. Bershtein ◽

V. V. Nikitin

Keyword(s):

Total Internal Reflection ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Surface Layers ◽

Internal Reflection Spectroscopy

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Study of Adsorption of Water-Soluble Porphyrin at Glass–Solution Interface in the Presence of Cationic Surfactant Admicelles by Means of Total Internal Reflection Spectroscopy

Bulletin of the Chemical Society of Japan ◽

10.1246/bcsj.71.1847 ◽

1998 ◽

Vol 71 (8) ◽

pp. 1847-1855 ◽

Cited By ~ 7

Author(s):

Junji Kobayashi ◽

Teruo Hinoue ◽

Hitoshi Watarai

Keyword(s):

Cationic Surfactant ◽

Total Internal Reflection ◽

Internal Reflection ◽

Water Soluble ◽

Reflection Spectroscopy ◽

Solution Interface ◽

Adsorption Of Water ◽

Water Soluble Porphyrin ◽

Internal Reflection Spectroscopy

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Total internal reflection spectroscopy for studying soft matter

Soft Matter ◽

10.1039/c3sm52817k ◽

2014 ◽

Vol 10 (8) ◽

pp. 1071 ◽

Cited By ~ 44

Author(s):

David A. Woods ◽

Colin D. Bain

Keyword(s):

Total Internal Reflection ◽

Soft Matter ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Internal Reflection Spectroscopy

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Multiple internal reflection spectroscopy for quantitative infrared analysis of thin-film surface coating for biological environment

Materials Science and Engineering C ◽

10.1016/s0928-4931(02)00239-4 ◽

2003 ◽

Vol 23 (1-2) ◽

pp. 99-103 ◽

Cited By ~ 9

Author(s):

N. Rochat ◽

A. Troussier ◽

A. Hoang ◽

F. Vinet

Keyword(s):

Thin Film ◽

Surface Coating ◽

Film Surface ◽

Internal Reflection ◽

Infrared Analysis ◽

Reflection Spectroscopy ◽

Thin Film Surface ◽

Biological Environment ◽

Internal Reflection Spectroscopy

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Fluorescence and Transient Absorption Spectra of Solid Surface: Development of Time-Resolved Total Internal Reflection Spectroscopy

Photochemistry on Solid Surfaces - Studies in Surface Science and Catalysis ◽

10.1016/s0167-2991(08)61179-9 ◽

1989 ◽

pp. 15-29 ◽

Cited By ~ 1

Author(s):

H. Masuhara

Keyword(s):

Absorption Spectra ◽

Solid Surface ◽

Total Internal Reflection ◽

Transient Absorption ◽

Internal Reflection ◽

Reflection Spectroscopy ◽

Time Resolved ◽

Transient Absorption Spectra ◽

Surface Development ◽

Internal Reflection Spectroscopy

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Using frustrated total internal reflection spectroscopy to study color centers in crystals

Journal of Optical Technology ◽

10.1364/jot.66.000046 ◽

1999 ◽

Vol 66 (1) ◽

pp. 46

Author(s):

E. V. Zhukova ◽

V. M. Zolotarev ◽

N. B. Margaryants ◽

L. P. Shishatskaya

Keyword(s):

Total Internal Reflection ◽

Internal Reflection ◽

Color Centers ◽

Reflection Spectroscopy ◽

Frustrated Total Internal Reflection ◽

Internal Reflection Spectroscopy

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