Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis
1993 ◽
Vol 345
(8-9)
◽
pp. 615-617
◽
2009 ◽
Vol 286
(1)
◽
pp. 11-16
◽
2001 ◽
Vol 64
(1)
◽
pp. 87-93
◽
1999 ◽
Vol 27
(7)
◽
pp. 659-669
◽
2011 ◽
Vol 258
(4)
◽
pp. 1322-1327
◽