Effect on Flat Surface Postural Stability Following Extended Durations on a Pitched Roof Setting

2003 ◽  
Author(s):  
Lloyd R. Wade ◽  
Wendi H. Weimar ◽  
Jerry Davis
Keyword(s):  
Postural Stability ◽  
Flat Surface

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

Calculation of many-beam dynamic electron diffraction without high-energy approximation

1996 ◽  
Vol 54 ◽  
pp. 128-129
Author(s):  
B. R. Ahn ◽  
N. J. Kim
Keyword(s):  
Electron Diffraction ◽  
Flat Surface ◽  
Dynamic Theory ◽  
High Energy ◽  
Perfect Crystal ◽  
Zone Axis ◽  
Beam Dynamic ◽  
Diffraction Angle ◽  
Energy Approximation ◽  
The Many

High energy approximation in dynamic theory of electron diffraction involves some intrinsic problems. First, the loss of theoretical strictness makes it difficult to comprehend the phenomena of electron diffraction. Secondly, it is difficult to believe that the approximation is reasonable especially in the following cases: 1) when accelerating voltage is not sufficiently high, 2) when the specimen is thick, 3) when the angle between the surface normal of the specimen and zone axis is large, and 4) when diffracted beam with large diffraction angle is included in the calculation. However, until now the method to calculate the many beam dynamic electron diffraction without the high energy approximation has not been proposed. For this reason, the authors propose a method to eliminate the high energy approximation in the calculation of many beam dynamic electron diffraction. In this method, a perfect crystal with flat surface was assumed. The method was applied to the calculation of [111] zone axis CBED patterns of Si.

Limitations of postural stability ratings

2007 ◽  
Author(s):  
Angela DiDomenico ◽  
Krystyna Gielo-Perczak ◽  
Raymond W. McGorry ◽  
Chien-Chi Chang
Keyword(s):  
Postural Stability
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