scholarly journals Metal-to-ligand and ligand-to-metal charge transfer in thin films of Prussian blue analogues investigated by X-ray absorption spectroscopy

2008 ◽  
Vol 10 (38) ◽  
pp. 5882 ◽  
Author(s):  
Sébastien Bonhommeau ◽  
Niko Pontius ◽  
Saioa Cobo ◽  
Lionel Salmon ◽  
Frank M. F. de Groot ◽  
...  
Keyword(s):  
Thin Films ◽  
Charge Transfer ◽  
Prussian Blue ◽  
Absorption Spectroscopy ◽  
Metal Charge ◽  
X Ray ◽  
Prussian Blue Analogues ◽  
X Ray Absorption ◽  
Metal Charge Transfer

Charge transfer process in Tl2Ba2Ca2Cu3O10 and Tl2Ba2CaCu2O8 thin films probed by polarized X-ray absorption spectroscopy

1997 ◽  
Vol 276 (5-6) ◽  
pp. 303-308 ◽  
Author(s):  
J.M. Chen ◽  
R.G. Liu ◽  
R.S. Liu ◽  
H.C. Lin ◽  
T.M. Uen ◽  
...  
Keyword(s):  
Thin Films ◽  
Charge Transfer ◽  
Absorption Spectroscopy ◽  
Transfer Process ◽  
Charge Transfer Process ◽  
X Ray ◽  
X Ray Absorption

Photoinduced Ferrimagnetic Systems in Prussian Blue Analogues CIxCo4[Fe(CN)6]y(CI= Alkali Cation). 2. X-ray Absorption Spectroscopy of the Metastable State

2000 ◽  
Vol 122 (28) ◽  
pp. 6653-6658 ◽  
Author(s):  
Christophe Cartier dit Moulin ◽  
Françoise Villain ◽  
Anne Bleuzen ◽  
Marie-Anne Arrio ◽  
Philippe Sainctavit ◽  
...  
Keyword(s):  
Prussian Blue ◽  
Absorption Spectroscopy ◽  
Metastable State ◽  
Alkali Cation ◽  
X Ray ◽  
Prussian Blue Analogues ◽  
X Ray Absorption

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Memory Applications ◽  
X Ray Absorption

scholarly journals Speciation and Lability of Ag-, AgCl-, and Ag2S-Nanoparticles in Soil Determined by X-ray Absorption Spectroscopy and Diffusive Gradients in Thin Films

2014 ◽  
Vol 49 (2) ◽  
pp. 897-905 ◽  
Author(s):  
R. Sekine ◽  
G. Brunetti ◽  
E. Donner ◽  
M. Khaksar ◽  
K. Vasilev ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
Ag2s Nanoparticles ◽  
Diffusive Gradients ◽  
X Ray Absorption

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Electron Spectroscopy ◽  
Practical Method ◽  
Decay Length ◽  
Total Electron ◽  
X Ray ◽  
Logarithmic Equation ◽  
X Ray Absorption

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

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