Magnetic properties of epitaxial TmFe2O4 thin films with an anomalous interfacial structure

2020 ◽  
Vol 8 (34) ◽  
pp. 11704-11714
Author(s):  
You Jin Kim ◽  
Shinya Konishi ◽  
Yuichiro Hayasaka ◽  
Ryo Ota ◽  
Ryosuke Tomozawa ◽  
...  

Epitaxial TmFe2O4 thin film with self-assembled interface structure was grown on yttria-stabilized zirconia substrate. TmFe2O4 phase itself shows glassy behavior and the interface leads to the exchange bias effect.

CrystEngComm ◽  
2020 ◽  
Vol 22 (6) ◽  
pp. 1096-1105 ◽  
Author(s):  
You Jin Kim ◽  
Shinya Konishi ◽  
Yuichiro Hayasaka ◽  
Itsuhiro Kakeya ◽  
Katsuhisa Tanaka

Thin film of LuFe2O4, one of multiferroics, deposited on an yttria-stabilized zirconia substrate shows a unique interface structure, leading to an exchange bias effect. The thin film itself undergoes spin glass or cluster glass transition.


2020 ◽  
Vol 116 (2) ◽  
pp. 022412
Author(s):  
K. Liu ◽  
S. C. Ma ◽  
Z. S. Zhang ◽  
X. W. Zhao ◽  
B. Yang ◽  
...  

2010 ◽  
Vol 168-169 ◽  
pp. 261-264 ◽  
Author(s):  
A.V. Chernichenko ◽  
I.S. Edelman ◽  
D.A. Velikanov ◽  
D.A. Marushchenko ◽  
Y.E. Greben’kova ◽  
...  

The surface morphology and magnetic properties of layered Ni-Ge films were investigated. The films surface has been shown to consist of the grains of 2 - 4 nm in height with the average radius of about 40-80 nm. Magnetization temperature dependences are different for FC and ZFC processes; in the latter case, the magnetization maximum is observed near the temperature Tm~50K. The exchange bias effect is observed at low temperatures. The results are explained by the formation of the antiferromagnetic phase in the interface between Ni and Ge layers due to the Ge and Ni mutual diffusion.


2019 ◽  
Vol 484 ◽  
pp. 307-312 ◽  
Author(s):  
Takahiro Ogasawara ◽  
Edward Jackson ◽  
Masakiyo Tsunoda ◽  
Yasuo Ando ◽  
Atsufumi Hirohata

2019 ◽  
Vol 28 (6) ◽  
pp. 068104
Author(s):  
Yu-Xuan Liu ◽  
Zhe-Hong Liu ◽  
Xu-Bin Ye ◽  
Xu-Dong Shen ◽  
Xiao Wang ◽  
...  

2010 ◽  
Vol 107 (5) ◽  
pp. 053901 ◽  
Author(s):  
H. W. Zheng ◽  
Y. F. Liu ◽  
W. Y. Zhang ◽  
S. J. Liu ◽  
H. R. Zhang ◽  
...  

2014 ◽  
Vol 588 ◽  
pp. 465-469 ◽  
Author(s):  
Marin Tadic ◽  
S.M. Savic ◽  
Z. Jaglicic ◽  
K. Vojisavljevic ◽  
A. Radojkovic ◽  
...  

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