Calibration of height in atomic force microscope images with subnanometer scale silicon dioxide steps

1992 ◽  
Vol 61 (20) ◽  
pp. 2479-2481 ◽  
Author(s):  
T. Ohmi ◽  
S. Aoyama
1993 ◽  
Vol 52 (1) ◽  
pp. 55-64 ◽  
Author(s):  
S.J. O'Shea ◽  
M.E. Welland ◽  
T.M.H. Wong

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