Far‐ultraviolet absolute reflectometer for optical constant determination of ultrahigh vacuum prepared thin films

1996 ◽  
Vol 67 (2) ◽  
pp. 497-502 ◽  
Author(s):  
J. A. Aznárez ◽  
J. I. Larruquert ◽  
J. A. Méndez
1992 ◽  
Vol 31 (7) ◽  
pp. 885
Author(s):  
Jacques Mouchart ◽  
Jacqueline Begel ◽  
Claudy Clément

1988 ◽  
Vol 27 (5) ◽  
pp. 954 ◽  
Author(s):  
Mool C. Gupta

1992 ◽  
Author(s):  
Xuantong Ying ◽  
Yuanhua Shen ◽  
Hang Xue ◽  
Jianhai Liu ◽  
Zhongjing Xing ◽  
...  

2007 ◽  
Vol 15 (8) ◽  
pp. 4445 ◽  
Author(s):  
Yi-Jun Jen ◽  
Cheng-Yu Peng ◽  
Heng-Hao Chang

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