Near‐field scanning optical microscopy in reflection: A study of far‐field collection geometry effects

1996 ◽  
Vol 67 (8) ◽  
pp. 2924-2929 ◽  
Author(s):  
Kenneth D. Weston ◽  
Jessie A. DeAro ◽  
Steven K. Buratto
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Far Field ◽  
Field Collection ◽  
Geometry Effects ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Progress in near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 46 ◽  
pp. 436-437
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Visible Region ◽  
Optical Microscope ◽  
Scanning Tunneling ◽  
Far Field ◽  
Tunneling Microscopy ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Scanning Electron

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

scholarly journals Attaboy! Attoboys, or the new Zeptoscopists

1993 ◽  
Vol 1 (8) ◽  
pp. 2-3 ◽  
Author(s):  
Jean-Paul Revel
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Far Field ◽  
Force Microscopy ◽  
Near Field Optics ◽  
Scanning Force ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

As the year ends there is a bumper crop of announcements of advances that I find absolutely amazing. First of course is the continued clever use of light as a veritable tool in manipulating everything from atoms (entrapping them in “atomic molasses”) to having tugs of war with biological motors (using “light tweezers”). But these developments will be for discussion another time. What I want to talk about in this installment are advances in Near Field Scanning Optical Microscopy (NSOM), which has now been used by Chichester and Betzig to visualize single molecules.In classical (far field) optics, resolution is limited by diffraction to about 1/2 the wavelength of the radiation used for imaging. Near field optics overcome this limitation by use of scanning techniques similar to those employed in Scanning Tunneling or Scanning Force Microscopy.

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Microscopic Investigation of Degradation Processes in a Polyfluorene Blend by Near-Field Scanning Optical Microscopy

2016 ◽  
Vol 49 (17) ◽  
pp. 6439-6444 ◽  
Author(s):  
Shiran Nabha-Barnea ◽  
Nitzan Maman ◽  
Iris Visoly-Fisher ◽  
Rafi Shikler
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Microscopic Investigation ◽  
Degradation Processes ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy for characterisation of photovoltaic materials

2004 ◽  
Vol 1 (9) ◽  
pp. 2292-2297 ◽  
Author(s):  
E. E. van Dyk ◽  
A. Karoui ◽  
A. H. La Rosa ◽  
G. Rozgonyi
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Photovoltaic Materials ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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