X-ray imaging of surface acoustic waves generated in semiconductor crystals by an external transducer

2003 ◽  
Vol 82 (9) ◽  
pp. 1374-1376 ◽  
Author(s):  
D. Shilo ◽  
E. Lakin ◽  
E. Zolotoyabko ◽  
J. Härtwig ◽  
J. Baruchel
AIP Advances ◽  
2013 ◽  
Vol 3 (7) ◽  
pp. 072127 ◽  
Author(s):  
T. Reusch ◽  
F. Schülein ◽  
C. Bömer ◽  
M. Osterhoff ◽  
A. Beerlink ◽  
...  

Author(s):  
Emil ZOLOTOYABKO ◽  
Eli JACOBSOHN ◽  
Dan SHECHTMAN ◽  
Benjamin KANTOR ◽  
Joseph SALZMAN

1993 ◽  
Vol 64 (2) ◽  
pp. 379-382 ◽  
Author(s):  
D. V. Roshchupkin ◽  
M. Brunel

2011 ◽  
Vol 110 (12) ◽  
pp. 124902 ◽  
Author(s):  
Dmitry Roshchupkin ◽  
Dmitry Irzhak ◽  
Anatolii Snigirev ◽  
Iraida Snigireva ◽  
Luc Ortega ◽  
...  

2000 ◽  
Vol 33 (4) ◽  
pp. 1019-1022 ◽  
Author(s):  
R. Tucoulou ◽  
R. Pascal ◽  
M. Brunel ◽  
O. Mathon ◽  
D. V. Roshchupkin ◽  
...  

High-resolution X-ray diffraction measurements were carried out on ZnO/Si devices under surface acoustic wave excitation and revealed some very clear satellite diffraction peaks that are obtained from the sinusoidal modulation of the near-surface region. This experiment shows that the propagation of a Rayleigh surface acoustic wave in a perfect crystal acts as a dynamical diffraction grating. The variation of the acoustic velocity has been followed across the crystal surface from the acoustic source region (beneath the ZnO film) to the far field region (not covered by the ZnO film).


Author(s):  
D.V Roshchupkin ◽  
R Tucoulou ◽  
A Masclet ◽  
M Brunel ◽  
I.A Schelokov ◽  
...  

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