Microanalytical characterization of multi-rare-earth nanocrystalline magnets by transmission electron microscopy and atom probe tomography

2006 ◽  
Vol 99 (8) ◽  
pp. 08B515 ◽  
Author(s):  
Y. Q. Wu ◽  
W. Tang ◽  
M. K. Miller ◽  
I. E. Anderson ◽  
R. W. McCallum ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Rare Earth ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Transmission Electron

scholarly journals Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires

2011 ◽  
Vol 17 (S2) ◽  
pp. 736-737 ◽  
Author(s):  
D Diercks ◽  
C Cheung ◽  
J Brewer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Rare Earth ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Transmission Electron ◽  
Atom Probe Tomography Analysis ◽  
Tomography Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Characterization of Precipitation Behavior in a Spray-Formed Al-Zn-Mg Alloy Using a Combination of Transmission Electron Microscopy and Three Dimensional Atom Probe Tomography

2008 ◽  
Vol 14 (S2) ◽  
pp. 1240-1241
Author(s):  
J Hwang ◽  
R Banerjee ◽  
M Kaufman
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
New Mexico ◽  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
Mg Alloy ◽  
Precipitation Behavior ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Origins of meteoritic nanodiamonds investigated by coordinated atom‐probe tomography and transmission electron microscopy studies

2019 ◽  
Vol 55 (6) ◽  
pp. 1382-1403 ◽  
Author(s):  
Josiah B. Lewis ◽  
Christine Floss ◽  
Dieter Isheim ◽  
Tyrone L. Daulton ◽  
David N. Seidman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Transmission Electron

scholarly journals Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails

Metals ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 749 ◽  
Author(s):  
Jun Wu ◽  
Roumen Petrov ◽  
Sebastian Kölling ◽  
Paul Koenraad ◽  
Loic Malet ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Rail Steel ◽  
Electron Backscatter Diffraction ◽  
Thickness Distribution ◽  
Atom Probe ◽  
Transmission Electron ◽  
Nanoscale Characterization ◽  
Scale Characterization

Micro- to nano-scale characterization of the microstructures in the white etching layer (WEL), observed in a Dutch R260 Mn grade rail steel, was performed via various techniques. Retained austenite in the WEL was identified via electron backscatter diffraction (EBSD), automatic crystallographic orientation mapping in transmission electron microscopy (ACOM-TEM), and X-ray diffraction (XRD). EBSD and ACOM-TEM methods were used to quantify grains (size range: 50 nm–4 μm) in the WEL. Transmission electron microscopy (TEM) was used to identify complex heterogeneous microstructural morphologies in the WEL: Nano-twinning substructure with high dislocation density in the WEL close to the rail surface and untransformed cementite and dislocations in the WEL close to the pearlite matrix. Furthermore, atom probe tomography (APT) revealed a heterogeneous through-thickness distribution of alloying elements in the WEL. Accordingly, the WEL is considered a multi-layered martensitic microstructure. These findings are supported by the temperature calculations from the shape analysis of the manganese profile from APT measurements, related to manganese diffusion. The deformation characteristics of the WEL and the pearlite beneath the WEL are discussed based on the EBSD measurements. The role of deformation in the martensitic phase transformation for WEL formation is discussed.

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