scholarly journals A transmission electron microscopy study of defects formed through the capping layer of self-assembled InAs∕GaAs quantum dot samples

2006 ◽  
Vol 99 (11) ◽  
pp. 113503 ◽  
Author(s):  
K. Sears ◽  
J. Wong-Leung ◽  
H. H. Tan ◽  
C. Jagadish
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantum Dot ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Capping Layer ◽  
Transmission Electron ◽  
Self Assembled ◽  
Gaas Quantum Dot

scholarly journals Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited CoFeB/MgO/CoFeB Magnetic Tunnel Junctions with Tantalum Capping Layer

2011 ◽  
Vol 17 (S2) ◽  
pp. 1860-1861
Author(s):  
R Petrova ◽  
R Ferreira ◽  
S Cardoso ◽  
P Freitas ◽  
S McVitie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Ion Beam ◽  
Magnetic Tunnel Junctions ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Capping Layer ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A transmission electron microscopy study of lattice defects in Mn3O4 hausmannite

1994 ◽  
Vol 70 (5) ◽  
pp. 1077-1094 ◽  
Author(s):  
J. J. Couderc ◽  
S. Fritsch ◽  
M. Brieu ◽  
G. Vanderschaeve ◽  
M. Fagot ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Lattice Defects ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron
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