Range of validity of the surface‐photovoltage diffusion length measurement: A computer simulation

1988 ◽  
Vol 64 (3) ◽  
pp. 1254-1265 ◽  
Author(s):  
P. J. McElheny ◽  
J. K. Arch ◽  
H.‐S. Lin ◽  
S. J. Fonash
Keyword(s):  
Computer Simulation ◽  
Diffusion Length ◽  
Length Measurement ◽  
Surface Photovoltage

Assessment of the surface‐photovoltage diffusion‐length measurement

1987 ◽  
Vol 51 (20) ◽  
pp. 1611-1613 ◽  
Author(s):  
P. J. McElheny ◽  
J. K. Arch ◽  
S. J. Fonash
Keyword(s):  
Diffusion Length ◽  
Length Measurement ◽  
Surface Photovoltage

Exciton diffusion length in some thermocleavable polythiophenes by the surface photovoltage method

2012 ◽  
Vol 161 (23-24) ◽  
pp. 2727-2731 ◽  
Author(s):  
J. Toušek ◽  
J. Toušková ◽  
Z. Remeš ◽  
J. Kousal ◽  
S.A. Gevorgyan ◽  
...  
Keyword(s):  
Diffusion Length ◽  
Surface Photovoltage ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length

Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires

Nano Letters ◽  
2016 ◽  
Vol 16 (5) ◽  
pp. 2938-2944 ◽  
Author(s):  
F. Donatini ◽  
Andres de Luna Bugallo ◽  
Pierre Tchoulfian ◽  
Gauthier Chicot ◽  
Corinne Sartel ◽  
...  
Keyword(s):  
Electric Field ◽  
Diffusion Length ◽  
Length Measurement ◽  
Carrier Diffusion ◽  
Field Imaging

Detection of copper contamination in silicon by surface photovoltage diffusion length measurements

1999 ◽  
Vol 74 (2) ◽  
pp. 278-280 ◽  
Author(s):  
Worth B. Henley ◽  
Deepak A. Ramappa ◽  
Lubek Jastrezbski
Keyword(s):  
Diffusion Length ◽  
Surface Photovoltage ◽  
Copper Contamination ◽  
Length Measurements
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