Stability of electrical properties of nitrogen‐rich, silicon‐rich, and stoichiometric silicon nitride films

1989 ◽  
Vol 66 (6) ◽  
pp. 2765-2767 ◽  
Author(s):  
W. S. Lau ◽  
S. J. Fonash ◽  
J. Kanicki
1985 ◽  
Vol 57 (2) ◽  
pp. 426-431 ◽  
Author(s):  
Shizuo Fujita ◽  
Toshiyuki Ohishi ◽  
Hideo Toyoshima ◽  
Akio Sasaki

1986 ◽  
Vol 68 ◽  
Author(s):  
Nancy Voke ◽  
Jerzy Kanicki

Hydrogenated amorphous silicon nitride films, prepared in various commercially available plasma enhanced chemical vapor deposition systems, have been investigated in terms of different deposition conditions.The full characterization of these gate insulators has been carried out by different techniques.Experimental data and interesting findings obtained from this study are presented.Special attention has been devoted to the influence of hydrogen on optical and electrical properties.


1993 ◽  
Vol 32 (Part 1, No. 12B) ◽  
pp. 6132-6136 ◽  
Author(s):  
Masahiro Yoshimoto ◽  
Tetsuya Ohtsuki ◽  
Kenji Takubo ◽  
Michio Komoda ◽  
Hiroyuki Matsunami

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