Stability of electrical properties of nitrogen‐rich, silicon‐rich, and stoichiometric silicon nitride films
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1973 ◽
Vol 120
(7)
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pp. 991
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2003 ◽
Vol 430
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pp. 100-103
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1993 ◽
Vol 32
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Vol 52
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pp. 209-214
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Vol 50
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pp. 331-337