Photon energy threshold for filling boron induced charge traps in SiO2 near the Si/SiO2 interface using second harmonic generation
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2010 ◽
Vol 247
(8)
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pp. 1997-2001
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1992 ◽
Vol 139
(2)
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pp. 133
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1985 ◽
Vol 46
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pp. 551-560
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2012 ◽
Vol 132
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pp. 1273-1277
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