Photon energy threshold for filling boron induced charge traps in SiO2 near the Si/SiO2 interface using second harmonic generation

2010 ◽  
Vol 97 (20) ◽  
pp. 202105 ◽  
Author(s):  
Heungman Park ◽  
Ying Xu ◽  
Kalman Varga ◽  
Jingbo Qi ◽  
Leonard C. Feldman ◽  
...  
1999 ◽  
Vol 68 (3) ◽  
pp. 623-627 ◽  
Author(s):  
T. Suzuki ◽  
D.E. Milovzorov ◽  
S. Kogo ◽  
M. Tsukakoshi ◽  
M. Aono

2010 ◽  
Vol 247 (8) ◽  
pp. 1997-2001 ◽  
Author(s):  
Heungman Park ◽  
Jingbo Qi ◽  
Ying Xu ◽  
Kalman Varga ◽  
Sharon M. Weiss ◽  
...  

1992 ◽  
Vol 139 (2) ◽  
pp. 133 ◽  
Author(s):  
N.M. Lawandy ◽  
T.J. Driscoll ◽  
C.L. Adler ◽  
N.M. Lawandy

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