Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization
2011 ◽
Vol 82
(3)
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pp. 033101
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2008 ◽
Vol 266
(10)
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pp. 2450-2452
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Keyword(s):
2001 ◽
Vol 146-147
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pp. 378-383
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Keyword(s):
1999 ◽
Vol 17
(5)
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pp. 2191
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2013 ◽
Vol 139
(22)
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pp. 224701
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