Scanning tunneling microscopy study on void formation by thermal decomposition of thin oxide layers on stepped Si surfaces

1998 ◽  
Vol 83 (8) ◽  
pp. 4091-4095 ◽  
Author(s):  
Ken Fujita ◽  
Heiji Watanabe ◽  
Masakazu Ichikawa
Langmuir ◽  
2009 ◽  
Vol 25 (23) ◽  
pp. 13606-13613 ◽  
Author(s):  
Florian Mögele ◽  
Donato Fantauzzi ◽  
Ulf Wiedwald ◽  
Paul Ziemann ◽  
Bernhard Rieger

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