Determination of optical constants of polymethyl methacrylate films from IR reflection-absorption spectra

2012 ◽  
Author(s):  
Simion Jitian ◽  
Ioan Bratu ◽  
Mihaela D. Lazar
Keyword(s):  
Absorption Spectra ◽  
Polymethyl Methacrylate ◽  
Optical Constants ◽  
Ir Reflection

Spectrophotometric study of the reactions of lanthanoids with bromopyrogallol red in the presence of cation active tensides

1982 ◽  
Vol 47 (2) ◽  
pp. 503-508 ◽  
Author(s):  
Irena Němcová ◽  
Pavla Plocková ◽  
Tran Hong Con
Keyword(s):  
Absorption Spectra ◽  
Photometric Determination ◽  
Spectrophotometric Study ◽  
Ternary Complexes ◽  
Optimal Conditions ◽  
Bromopyrogallol Red ◽  
Binary Complexes

The absorption spectra of the binary complexes of lanthanoids with bromopyrogallol red were measured and the formation of ternary complexes with cation active tenside, Septonex, was studied. Optimal conditions were found for the formation of these complexes and the possibility of their use in the photometric determination of lanthanoids was demonstrated on several examples.

scholarly journals Validated spectral manipulations for determination of an anti-neoplastic drug and its related impurities including its hazardous degradation product

RSC Advances ◽  
2021 ◽  
Vol 11 (35) ◽  
pp. 21332-21342
Author(s):  
Ibrahim A. Naguib ◽  
Eglal A. Abdelaleem ◽  
Eman S. Hassan ◽  
Aml A. Emam
Keyword(s):  
Absorption Spectra ◽  
Degradation Product ◽  
Zero Order ◽  
Sterile Water ◽  
Related Impurities ◽  
Amino Imidazole

Zero order absorption spectra of 12 μg mL−1 of Dacarbazine (), 5-amino-imidazole-4 carboxamide (), and 2-azahypoxanthine (…) using sterile water as a blank.

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Determination of optical constants and thicknesses of In2O3:Sn films from transmittance data

2007 ◽  
Vol 515 (18) ◽  
pp. 7387-7392 ◽  
Author(s):  
Fachun Lai ◽  
Limei Lin ◽  
Rongquan Gai ◽  
Yongzhong Lin ◽  
Zhigao Huang
Keyword(s):  
Optical Constants

Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors

1991 ◽  
Vol 222 ◽  
Author(s):  
B. Johs ◽  
J. L. Edwards ◽  
K. T. Shiralagi ◽  
R. Droopad ◽  
K. Y. Choi ◽  
...  
Keyword(s):  
Real Time ◽  
Optical Constants ◽  
Growth Parameters ◽  
Ex Situ ◽  
Time Analysis ◽  
Mbe Growth ◽  
In Situ Data ◽  
Real Time Analysis

ABSTRACTA modular spectroscopic ellipsometer, capable of both in-situ and ex-situ operation, has been used to measure important growth parameters of GaAs/AIGaAs structures. The ex-situ measurements provided layer thicknesses and compositions of the grown structures. In-situ ellipsometric measurements allowed the determination of growth rates, layer thicknesses, and high temperature optical constants. By performing a regression analysis of the in-situ data in real-time, the thickness and composition of an AIGaAs layer were extracted during the MBE growth of the structure.

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